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Volumn 100, Issue 20, 2008, Pages

Atomic-layer resolved magnetic and electronic structure analysis of Ni thin film on a Cu(001) surface by diffraction spectroscopy

(7) Matsui, Fumihiko a,b Matsushita, Tomohiro c Kato, Yukako a Hashimoto, Mie d Inaji, Kanako a Guo, Fang Zhun c Daimon, Hiroshi a,b

a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

d JAPAN ATOMIC ENERGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; ELECTRON EMISSION; ELECTRONIC STRUCTURE; MAGNETIC STRUCTURE; NANOTECHNOLOGY; NICKEL;

DIFFRACTION SPECTROSCOPY; PHOTON ENERGY; SPIN REORIENTATION TRANSITION;

ULTRATHIN FILMS;

EID: 44149107590 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.207201 Document Type: Article

Times cited : (68)

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