Construction of two-dimensional photoelectron spectrometer at SPring-8

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1493-1496

  Kotsugi, M ^a,c   Miyatake, Y ^b   Enomoto, K ^b   Fukumoto, K ^b   Kobayashi, A ^b   Nakatani, T ^d   Saitoh, Y ^c   Matsushita, T ^d   Imada, S ^a   Furuhata, T ^a   Suga, S ^a   Soda, K ^e   Jinno, M ^f   Hirano, T ^f   Hattori, K ^b   Daimon, H ^b  

^a OSAKA UNIVERSITY   (Japan)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^e NAGOYA UNIVERSITY   (Japan)

^f SHIMADZU CORPORATION   (Japan)

Author keywords

Angle resolved photoelectron spectroscopy; Circular dicroism in angular distribution; Display type spherical mirror analyzer; Energy resolution; Photoelectron angular distribution; Photoelectron diffraction

Indexed keywords

KINETIC ENERGY; KINETICS; LOW ENERGY ELECTRON DIFFRACTION; MIRRORS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; QUANTUM CHEMISTRY; SILICON COMPOUNDS; SPECTROMETERS; SPHERES;

ANGLE RESOLVED PHOTOELECTRON SPECTROSCOPY; ENERGY RESOLUTIONS; PHOTOELECTRON ANGULAR DISTRIBUTIONS; PHOTOELECTRON DIFFRACTION; SPHERICAL MIRROR;

ANGULAR DISTRIBUTION;

EID: 0009350169     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00733-1     Document Type: Article

References (11)

1. H. Daimon et al., Rev. Sci. Instr. 66 (2) (1995) 1510.
2. K. Nakatsuji et al., Surf. Sci. 363 (1996) 321.
3. H. Nishimoto et al., J. Phys.: Condens. Matter 8 (1996) 2715.
4. T. Okuda et al., J. Phys. Soc. Jpn. 68 (1999) 1404.
5. T. Nakatani, J. Synchrotron Radiat. 3 (1996) 239.
6. R. Schellenberg et al., Phys. Rev. B 57 (1998) 14310.
7. H. Daimon et al., Rev. Sci. Instr. 59 (1988) 545.
8. H. Daimon et al., Rev. Sci. Instr. 61 (1990) 205.
9. H. Daimon et al., Rev. Sci. Instr. 61 (1990) 57.
10. H. Nishimoto et al., Rev. Sci. Instr. 64 (1993) 2857.
11. H. Daimon et al., J. Electron Spectrosc. Relat. Phenom. 76 (1995) 55.