Structural and optical analysis of nanocrystalline thin films of mixed rare earth oxides (Y1-xErx)2O3

Thin Solid Films

Volumn 518, Issue 14, 2010, Pages 4058-4065

  El Hagary, M ^a,b   Emam Ismail, M ^a,c   Mohamed, S H ^a,d   Hamid, A S ^a,b   Althoyaib, S ^a  

^a QASSIM UNIVERSITY   (Saudi Arabia)

^b Helwan University   (Egypt)

^c Ain Shams University   (Egypt)

^d Sohag University   (Egypt)

Author keywords

Optical properties; Rare earth oxides; Thin films; X ray diffraction

Indexed keywords

CRYSTALLINITIES; CUBIC PHASE; DIFFERENT SUBSTRATES; DIRECT TRANSITION; ELECTRON BEAM EVAPORATION; ENERGY BANDGAPS; FUSED SILICA GLASS; INDIRECT TRANSITION; MIXED RARE EARTH; MIXING PARAMETERS; NANOCRYSTALLINE THIN FILMS; OPTICAL ANALYSIS; OPTICAL SPECTROPHOTOMETRY; RARE EARTH OXIDE; RARE EARTH OXIDES; RELATIVE FRACTION; STRUCTURAL AND OPTICAL PROPERTIES; SUBSTRATE TEMPERATURE; XRD;

CRYSTALLITE SIZE; ELECTRON BEAMS; ENERGY GAP; ERBIUM; FUSED SILICA; OPTICAL BAND GAPS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; OXIDES; RARE EARTHS; SILICA; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

OPTICAL FILMS;

EID: 77950629358     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.02.024     Document Type: Article

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