Engineered oxide thin films as 100% lattice match buffer layers for YBCO coated conductors

Solid-State Electronics

Volumn 47, Issue 12, 2003, Pages 2171-2175

  Akin, Y ^a,b   Heiba, Z K ^a,c   Sigmund, W ^b   Hascicek, Y S ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF FLORIDA   (United States)

^c Ain Shams University   (Egypt)

Author keywords

Buffer layers; Eu2O3; Lattice parameter; Sol gel; Yb2O3; YBCO

Indexed keywords

ELECTRIC CONDUCTORS; LATTICE CONSTANTS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

BUFFER LAYERS;

THIN FILMS;

EID: 0142075253     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(03)00192-8     Document Type: Article

References (14)

1. Norton D.P. Science and technology of high-temperature superconducting films. Annu. Rev. Mater. Sci. 28:1998;299-343.
2. x thick films on biaxially textured metals Appl. Phys. Lett. 69(12):1996;1795-1797.
3. 7 films on rolled-textured metals for high-temperature superconducting applications. Mater. Sci. Eng. B-Solid. 56(2-3):1998;86-94.
4. 3 buffer layers on rolled-Ni substrates using reactive evaporation for HTS-coated conductors. Supercond. Sci. Technol. 12:1999;319-325.
5. Paranthaman M.P., Chirayil T.G., List F.A., Cui X.T., Goyal A., Lee D.F.et al. Fabrication of long lengths of epitaxial buffer layers on biaxially textured nickel substrates using a continuous reel-to-reel dip-coating unit. J. Am. Ceram. Soc. 84(2):2001;273-278.
6. 2 thin films on nickel tape by sol-gel process. IEEE T Appl Supercond, in press.
7. Akin, Y, Aslanoglu, Z, Celik, E, Sigmund, W, Hascicek, YS. Textured growth of multi-layered buffer layers on Ni tape by sol-gelprocess. IEEE T Appl Supercon, in press.
8. 7-δ coated conductors Appl. Phys. Lett. 80(15):2002;2710-2712.
9. El-Kawni M.I., Mutlu I.H., Aslanoglu Z., Akin Y., Hascicek Y.S. Non-vacuum Er-123 films on buffer layered Ni tapes: Processing, growth and properties. J. Supercond. 15(3):2002;191-194.
10. 7 bicrystals. Phys. Rev. B. 41(7):1990;4038-4049.
11. Kroeger DM, Goyal A. Critical current and microstructure in oxidesuperconductors. JOM 42-47.
12. 3 buffer layers on biaxially textured-Ni (1. 0 0) Substrates by sol-gel process Mater. Res. Soc. Symp. Proc. 574:1999;51-56.
13. 3 applying rietveld method J. Appl. Crystallogr. 35(5):2002;577-580.
14. Holland T.J.B., Redfern S.A.T. Unit cell refinement from powder diffraction data: The use of regression diagnostics. Mineral. Mag. 61(1):1997;65-77.