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Volumn 515, Issue 5, 2007, Pages 2885-2890

Optical properties of erbium oxide thin films deposited by electron beam evaporation

Author keywords

Erbium oxide; Inhomogeneous films; Optical coatings; Optical properties

Indexed keywords

DEPOSITION; ERBIUM COMPOUNDS; OPTICAL COATINGS; PARTIAL PRESSURE; REFRACTIVE INDEX; STOICHIOMETRY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33845944057     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.048     Document Type: Article
Times cited : (28)

References (25)
  • 14
    • 0003828439 scopus 로고
    • Briggs D., and Seah M.P. (Eds), John Wiley, Chichester
    • In: Briggs D., and Seah M.P. (Eds). Practical Surface Analysis (1988), John Wiley, Chichester
    • (1988) Practical Surface Analysis


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.