Structural and optical properties of polycrystalline thin films of rare earth oxides grown on fused quartz by low pressure MOCVD

Journal of Crystal Growth

Volumn 276, Issue 1-2, 2005, Pages 148-157

  Singh, M P ^a   Shivashankar, S A ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

A1. Disordered substrate; A3. Metalorganic chemical vapor deposition; A3. Texture; A3. Thin films; B1. Rare earth oxides

Indexed keywords

CRYSTAL STRUCTURE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; PRESSURE EFFECTS; QUARTZ; SUBSTRATES; TEXTURES;

DISORDERED SUBSTRATE; INTERATOMIC DISTANCE; PRECURSORS; RARE EARTH OXIDES;

THIN FILMS;

EID: 20344371227     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.325     Document Type: Article

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