Fabrication and ellipsometric investigation of thin films of rare-earth oxides

Solid State Phenomena

Volumn 63-64, Issue , 1998, Pages 341-346

  Fursenko, O V ^a   Semikina, T V ^b   Shmyrjeva, A N ^b  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

^b NATIONAL TECHNICAL UNIVERSITY OF UKRAINE   (Ukraine)

Author keywords

Ellipsometry; Optical Constant; Rare Earth Oxides; Thin Films

Indexed keywords

CERIUM COMPOUNDS; ELECTRIC INSULATING MATERIALS; ELLIPSOMETRY; EUROPIUM COMPOUNDS; EVAPORATION; GADOLINIUM COMPOUNDS; OXIDES; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THIN FILMS; VAPOR DEPOSITION;

CERIUM DIOXIDE; EUROPIUM OXIDE; FLASH EVAPORATION; GADOLINIUM OXIDE; REFLECTANCE ELLIPSOMETRY;

DIELECTRIC FILMS;

EID: 17344366695     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.63-64.341     Document Type: Article

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