Structural and optical properties of CeO2 thin films prepared by spray pyrolysis

Thin Solid Films

Volumn 379, Issue 1-2, 2000, Pages 23-27

  Elidrissi, B ^a   Addou, M ^a   Regragui, M ^a   Monty, C ^b   Bougrine, A ^a   Kachouane, A ^a  

^a IBN TOFAIL UNIVERSITY   (Morocco)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; COMPOSITION EFFECTS; FILM PREPARATION; GLASS; MICROANALYSIS; MORPHOLOGY; PYROLYSIS; RAMAN SPECTROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON PROBE MICROANALYSIS; SPRAY PYROLYSIS;

SEMICONDUCTING FILMS;

EID: 0034503514     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01404-8     Document Type: Article

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