SCOPUS 정보 검색 플랫폼

Volumn 96, Issue 5, 2004, Pages 2689-2692

Effect of substrate-induced strain on the structural, electrical, and optical properties of polycrystalline ZnO thin films

(3) Ghosh, R a Basak, D a Fujihara, S b

a DEPARTMENT OF MATERIALS SCIENCE (India)

b KEIO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; BINDING ENERGY; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; FILM GROWTH; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STRAIN; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DRAIN COAT METHOD; EPILAYERS; LATTICE MISMATCH; STRUCTURAL PROPERTIES;

ZINC OXIDE;

EID: 4944221246 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1769598 Document Type: Article

Times cited : (470)

References (16)

1
- 0016564149
- C. Klingshirn, Phys. Status Solidi B 71, 547 (1975).
- (1975) Phys. Status Solidi B , vol.71 , pp. 547
- Klingshirn, C.¹

2
- 0001066492
- H. D. Sun et al., Appl. Phys. Lett. 77, 4250 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 4250
- Sun, H.D.¹

3
- 0037467956
- H. Y. Lee, H. J. Ko, and T. Yao, Appl. Phys. Lett. 82, 523 (2003).
- (2003) Appl. Phys. Lett. , vol.82 , pp. 523
- Lee, H.Y.¹ Ko, H.J.² Yao, T.³

4
- 0036571917
- W. S. Shi, O. Agyeman, and C. N. Xu, J. Appl. Phys. 91, 5640 (2002).
- (2002) J. Appl. Phys. , vol.91 , pp. 5640
- Shi, W.S.¹ Agyeman, O.² Xu, C.N.³

5
- 0012095557
- J. Zhai, L. Zhang, and X. Yao, Ceram. Int. 26, 883 (2000).
- (2000) Ceram. Int. , vol.26 , pp. 883
- Zhai, J.¹ Zhang, L.² Yao, X.³

6
- 0000601652
- A. B. M. Almamun Ashrafi, A. Ueta, A. Avramescu, H. Kumano, I. Suemune, Y. W. Ok, and T. Y. Seong, Appl. Phys. Lett. 76, 550 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 550
- Ashrafi, A.B.M.A.¹ Ueta, A.² Avramescu, A.³ Kumano, H.⁴ Suemune, I.⁵ Ok, Y.W.⁶ Seong, T.Y.⁷

7
- 0001424613
- R. D. Vispute et al., Appl. Phys. Lett. 73, 348 (1998).
- (1998) Appl. Phys. Lett. , vol.73 , pp. 348
- Vispute, R.D.¹

8
- 85045825028
- M. A. Johnson, S. Fujita, W. H. Rowland, Jr., W. C. Highes, J. W. Cook, Jr., and J. F. Schrtzina, J. Electron. Mater. 21, 157 (1992).
- (1992) J. Electron. Mater. , vol.21 , pp. 157
- Johnson, M.A.¹ Fujita, S.² Rowland Jr., W.H.³ Highes, W.C.⁴ Cook Jr., J.W.⁵ Schrtzina, J.F.⁶

9
- 0037811020
- D. Basak, G. Amin, B. Mallick, G. K. Paul, and S. K. Sen, J. Cryst. Growth 256, 73 (2003).
- (2003) J. Cryst. Growth , vol.256 , pp. 73
- Basak, D.¹ Amin, G.² Mallick, B.³ Paul, G.K.⁴ Sen, S.K.⁵

10
- 0032099920
- M. Ohyama, H. Kozuka, and T. Yoko, J. Am. Ceram. Soc. 81, 1622 (1998).
- (1998) J. Am. Ceram. Soc. , vol.81 , pp. 1622
- Ohyama, M.¹ Kozuka, H.² Yoko, T.³

11
- 0035899562
- S. Fujihara, C. Sasaki, and T. Kimura, Appl. Surf. Sci. 180, 341 (2001).
- (2001) Appl. Surf. Sci. , vol.180 , pp. 341
- Fujihara, S.¹ Sasaki, C.² Kimura, T.³

12
- 84862181101
- JCPDS, USA
- Selected Power Diffraction Data for Metals and Alloys (JCPDS, USA, 1978), Vol. I, p. 108.
- (1978) Selected Power Diffraction Data for Metals and Alloys , vol.1 , pp. 108

13
- 79955999115
- H. C. Ong, A. X. E. Zhu, and G. T. Du, Appl. Phys. Lett. 80, 941 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 941
- Ong, H.C.¹ Zhu, A.X.E.² Du, G.T.³

14
- 0035875501
- M. S. Amer, J. Maguire, R. Biggers, J. Busbee, and S. R. Leclair, J. Appl. Phys. 89, 8030 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 8030
- Amer, M.S.¹ Maguire, J.² Biggers, R.³ Busbee, J.⁴ Leclair, S.R.⁵

15
- 0035254895
- D. H. Zhang, T. L. Yang, Q. P. Wang, and D. J. Zhang, Mater. Chem. Phys. 68, 233 (2001).
- (2001) Mater. Chem. Phys. , vol.68 , pp. 233
- Zhang, D.H.¹ Yang, T.L.² Wang, Q.P.³ Zhang, D.J.⁴

16
- 0041511976
- D. G. Zhao, S. J. Xu, M. H. Xie, S. Y. Tong, and H. Yang, Appl. Phys. Lett. 83, 677 (2003).
- (2003) Appl. Phys. Lett. , vol.83 , pp. 677
- Zhao, D.G.¹ Xu, S.J.² Xie, M.H.³ Tong, S.Y.⁴ Yang, H.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.