Techniques for measuring the microwave dielectric properties of materials

Metrologia

Volumn 47, Issue 2, 2010, Pages

  Kaatze, Udo ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BASIC RESEARCH; CALIBRATION PROCEDURE; COMPLEX PERMITTIVITY; FAST RESPONSE TIME; FREQUENCY DOMAINS; MANUFACTURING PROCESS; MEASUREMENT SYSTEM; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; MONITORING AND CONTROL; REFERENCE MATERIAL; RESONANT METHODS; SAMPLE CELL; SELECTED EXAMPLES;

DIELECTRIC MATERIALS; INDUSTRIAL RESEARCH; MATERIALS PROPERTIES; MICROWAVES; PERMITTIVITY;

TIME DOMAIN ANALYSIS;

EID: 77949470251     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/47/2/S10     Document Type: Article

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