-
2
-
-
0020204681
-
Dielectric and optical measurements from 30 to 1000 GHz
-
0033-7722
-
Birch J R and Clarke R N 1982 Dielectric and optical measurements from 30 to 1000 GHz Radio Electron. Eng. 52 565-84
-
(1982)
Radio Electron. Eng.
, vol.52
, Issue.11-12
, pp. 565-584
-
-
Birch, J.R.1
Clarke, R.N.2
-
3
-
-
0004261015
-
-
Anderson J C 1964 Dielectrics (Science Paperbacks, Modern Electrical Studies) (London: Chapman and Hall)
-
(1964)
Dielectrics
-
-
Anderson, J.C.1
-
7
-
-
0014882762
-
Measurement of the intrinsic properties of materials by time domain techniques
-
0018-9456
-
Nicolson A M and Ross G F 1970 Measurement of the intrinsic properties of materials by time domain techniques IEEE Trans. Instrum. Meas. 19 377-82
-
(1970)
IEEE Trans. Instrum. Meas.
, vol.19
, pp. 377-382
-
-
Nicolson, A.M.1
Ross, G.F.2
-
8
-
-
0015980602
-
Automatic measurement of complex dielectric constant and permeability at microwave frequencies
-
0018-9219
-
Weir W B 1974 Automatic measurement of complex dielectric constant and permeability at microwave frequencies Proc. IEEE 62 33-6
-
(1974)
Proc. IEEE
, vol.62
, Issue.1
, pp. 33-36
-
-
Weir, W.B.1
-
9
-
-
0025474631
-
Improved technique for determining complex permittivity with the transmission/reflection method
-
10.1109/22.57336 0018-9480
-
Baker-Jarvis J, Vanzura E J and Kissick W A 1990 Improved technique for determining complex permittivity with the transmission/reflection method IEEE Trans. Microw. Theory Tech. 38 1096-103
-
(1990)
IEEE Trans. Microw. Theory Tech.
, vol.38
, Issue.8
, pp. 1096-1103
-
-
Baker-Jarvis, J.1
Vanzura, E.J.2
Kissick, W.A.3
-
12
-
-
0030782893
-
Noniterative stable transmission/reflection method for low-loss material complex permittivity determination
-
10.1109/22.552032 0018-9480
-
Boughriet A H, Legrand C and Chapoton A 1997 Noniterative stable transmission/reflection method for low-loss material complex permittivity determination IEEE Trans. Microw. Theory Tech. 45 52-7
-
(1997)
IEEE Trans. Microw. Theory Tech.
, vol.45
, Issue.1
, pp. 52-57
-
-
Boughriet, A.H.1
Legrand, C.2
Chapoton, A.3
-
13
-
-
0025471499
-
Dielectric measurements on reference liquids using automatic network analysers and calculable geometries
-
0957-0233 005
-
Jenkins S, Hodgetts T E, Clarke R N and Preece A W 1990 Dielectric measurements on reference liquids using automatic network analysers and calculable geometries Meas. Sci. Technol. 1 691-702
-
(1990)
Meas. Sci. Technol.
, vol.1
, Issue.8
, pp. 691-702
-
-
Jenkins, S.1
Hodgetts, T.E.2
Clarke, R.N.3
Preece, A.W.4
-
17
-
-
0019054932
-
Coaxial line reflection methods for measuring dielectric properties of biological substances at radio and microwave frequencies-a review
-
0018-9456
-
Stuchly M A and Stuchly S S 1980 Coaxial line reflection methods for measuring dielectric properties of biological substances at radio and microwave frequencies-a review IEEE Trans. Instrum. Meas. 29 176-83
-
(1980)
IEEE Trans. Instrum. Meas.
, vol.29
, pp. 176-183
-
-
Stuchly, M.A.1
Stuchly, S.S.2
-
18
-
-
0019541992
-
Reflection of an open-ended coaxial line and application to non-destructive measurement of materials
-
0018-9456
-
Mosig J R, Besson J-C E, Gex-Fabry M and Gardiol F E 1981 Reflection of an open-ended coaxial line and application to non-destructive measurement of materials IEEE Trans. Instrum. Meas. 30 46-51
-
(1981)
IEEE Trans. Instrum. Meas.
, vol.30
, pp. 46-51
-
-
Mosig, J.R.1
Besson, J.-C.E.2
Gex-Fabry, M.3
Gardiol, F.E.4
-
21
-
-
0028523064
-
Analysis of an open-ended coaxial probe with lift-off for nondestructive testing
-
10.1109/19.328897 0018-9456
-
Baker-Jarvis J, Janezic M D, Domich P D and Geyer R G 1994 Analysis of an open-ended coaxial probe with lift-off for nondestructive testing IEEE Trans. Instrum. Meas. 45 711-8
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.5
, pp. 711-718
-
-
Baker-Jarvis, J.1
Janezic, M.D.2
Domich, P.D.3
Geyer, R.G.4
-
22
-
-
0021973959
-
Simple nondestructive method for the measurement of material permittivity
-
0022-2739
-
Sphicopoulos T, Teodoridis V and Gardiol F E 1985 Simple nondestructive method for the measurement of material permittivity J. Microw. Power 20 165-72
-
(1985)
J. Microw. Power
, vol.20
, Issue.3
, pp. 165-172
-
-
Sphicopoulos, T.1
Teodoridis, V.2
Gardiol, F.E.3
-
23
-
-
0027543051
-
Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slab backed by a conducting plate
-
10.1109/19.206673 0018-9456
-
Bakhtiari S, Ganchev S and Zoughi R 1993 Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slab backed by a conducting plate IEEE Trans. Instrum. Meas. 42 19-24
-
(1993)
IEEE Trans. Instrum. Meas.
, vol.42
, Issue.1
, pp. 19-24
-
-
Bakhtiari, S.1
Ganchev, S.2
Zoughi, R.3
-
25
-
-
84938451651
-
Laser beams and resonators
-
0018-9219
-
Kogelnik H and Li T 1966 Laser beams and resonators Proc. IEEE 54 1312-29
-
(1966)
Proc. IEEE
, vol.54
, pp. 1312-1329
-
-
Kogelnik, H.1
Li, T.2
-
27
-
-
0021479731
-
Millimetre-wave Gaussian beam modes optics and corrugated feed horns
-
Wylde R J 1984 Millimetre-wave Gaussian beam modes optics and corrugated feed horns Proc. IEE H 131 258-62
-
(1984)
Proc. IEE H
, vol.131
, pp. 258-262
-
-
Wylde, R.J.1
-
28
-
-
0022488559
-
The measurement of the properties of materials
-
0018-9219
-
Afsar M N, Birch J R and Clarke R N 1986 The measurement of the properties of materials Proc. IEEE 74 183-98
-
(1986)
Proc. IEEE
, vol.74
, Issue.1
, pp. 183-198
-
-
Afsar, M.N.1
Birch, J.R.2
Clarke, R.N.3
-
29
-
-
0018531787
-
Measurements of the complex refractive index of isotropic and anisotropic materials at 35 GHz using a free-space microwave bridge
-
0022-3727 005
-
Cook R J and Rosenberg C B 1979 Measurements of the complex refractive index of isotropic and anisotropic materials at 35 GHz using a free-space microwave bridge J. Phys. D: Appl. Phys. 12 1643-52
-
(1979)
J. Phys. D: Appl. Phys.
, vol.12
, Issue.10
, pp. 1643-1652
-
-
Cook, R.J.1
Rosenberg, C.B.2
-
30
-
-
0016786530
-
Electrical standards of measurement: Part 3. Submillimetre-wave measurements and standards
-
0018-9219
-
Stone N W B, Harries J E, Fuller D W E, Edwards J G, Costley A E, Chamberlain J, Blaney T G, Birch J R and Bailey A E 1975 Electrical standards of measurement: Part 3. Submillimetre-wave measurements and standards Proc. IEEE 122 1054-70
-
(1975)
Proc. IEEE
, vol.122
, pp. 1054-1070
-
-
Stone, N.W.B.1
Harries, J.E.2
Fuller, D.W.E.3
Edwards, J.G.4
Costley, A.E.5
Chamberlain, J.6
Blaney, T.G.7
Birch, J.R.8
Bailey, A.E.9
-
31
-
-
0017949107
-
Free space permittivity measurements on dielectric materials at millimeter wavelengths
-
0018-9456
-
Campbell C K 1978 Free space permittivity measurements on dielectric materials at millimeter wavelengths IEEE Trans. Instrum. Meas. 27 54-8
-
(1978)
IEEE Trans. Instrum. Meas.
, vol.27
, pp. 54-58
-
-
Campbell, C.K.1
-
33
-
-
33646890957
-
Use of a Gaussian beam range and reflectivity arch for characterisation of random panels for a naval application
-
10.1049/cp:20030098
-
Qureshi W M A, Hill L D, Scott M and Lewis R A 2003 Use of a Gaussian beam range and reflectivity arch for characterisation of random panels for a naval application Proc. Int. Conf. on Antennas and Propagation (ICAP) (University of Exeter) (London: IEE) pp 405-8
-
(2003)
Proc. Int. Conf. on Antennas and Propagation (ICAP)
, vol.2003
, pp. 405-408
-
-
Qureshi, W.M.A.1
Hill, L.D.2
Scott, M.3
Lewis, R.A.4
-
34
-
-
0038236955
-
Material characterization using a quasi-optical measurement system
-
10.1109/TIM.2003.810042 0018-9456
-
Gagnon N, Shaker J, Berini P, Roy L and Petosa A 2003 Material characterization using a quasi-optical measurement system IEEE Trans. Instrum. Meas. 52 333-36
-
(2003)
IEEE Trans. Instrum. Meas.
, vol.52
, Issue.2
, pp. 333-336
-
-
Gagnon, N.1
Shaker, J.2
Berini, P.3
Roy, L.4
Petosa, A.5
-
35
-
-
3042606526
-
Exact solution for a gyromagnetic sample and measurements on a ferrite
-
10.1109/TMTT.1958.1125186 0018-9480
-
Bussey H E and Steinert L A 1958 Exact solution for a gyromagnetic sample and measurements on a ferrite IRE Trans. Microw. Theory Tech. 6 72-6
-
(1958)
IRE Trans. Microw. Theory Tech.
, vol.6
, Issue.1
, pp. 72-76
-
-
Bussey, H.E.1
Steinert, L.A.2
-
38
-
-
0002134701
-
Resonance methods of dielectric measurement at centimetre wavelengths
-
Horner F, Taylor T A, Dunsmuir R, Lamb J and Jackson W 1946 Resonance methods of dielectric measurement at centimetre wavelengths J. IEE 93 (Part III) 53-68
-
(1946)
J. IEE
, vol.93
, Issue.PART III
, pp. 53-68
-
-
Horner, F.1
Taylor, T.A.2
Dunsmuir, R.3
Lamb, J.4
Jackson, W.5
-
39
-
-
0016359037
-
Comparison of cavity and open-resonator measurements of permittivity and loss angle at 35 GHz
-
0018-9456
-
Cook R J, Jones R G and Rosenberg C B 1974 Comparison of cavity and open-resonator measurements of permittivity and loss angle at 35 GHz IEEE Trans. Instrum. Meas. 23 438-42
-
(1974)
IEEE Trans. Instrum. Meas.
, vol.23
, pp. 438-442
-
-
Cook, R.J.1
Jones, R.G.2
Rosenberg, C.B.3
-
40
-
-
0015587890
-
A TE01n cavity resonator method to determine the complex permittivity of low loss liquids at millimetre wavelengths
-
10.1063/1.1686073 0034-6748
-
Stumper U 1973 A TE01n cavity resonator method to determine the complex permittivity of low loss liquids at millimetre wavelengths Rev. Sci. Instrum. 44 165-9
-
(1973)
Rev. Sci. Instrum.
, vol.44
, Issue.2
, pp. 165-169
-
-
Stumper, U.1
-
43
-
-
3042520945
-
The measurement of permittivity and power factor of dielectrics at frequencies from 300 to 600 Mc;s
-
0020-3270
-
Parry J V 1951 The measurement of permittivity and power factor of dielectrics at frequencies from 300 to 600 Mc;s Proc. Inst. Electr. Eng. 98 303-11
-
(1951)
Proc. Inst. Electr. Eng.
, vol.98
, pp. 303-311
-
-
Parry, J.V.1
-
44
-
-
0018995257
-
A high-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: Part A. Theoretical analysis of the method
-
10.1109/TMTT.1980.1130045 0018-9480
-
Kaçzkowski A and Milewski 1980 A high-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: Part A. Theoretical analysis of the method IEEE Trans. Microw. Theory Tech. 28 225-8
-
(1980)
IEEE Trans. Microw. Theory Tech.
, vol.28
, Issue.3
, pp. 225-228
-
-
Kaçzkowski, A.1
Milewski2
-
45
-
-
0001668284
-
The accurate measurement of permittivity by means of an open resonator
-
0080-4630 A
-
Cullen A L and Yu P K 1971 The accurate measurement of permittivity by means of an open resonator Proc. R. Soc. Lond. A 325 493-509
-
(1971)
Proc. R. Soc. Lond.
, vol.325
, Issue.1536
, pp. 493-509
-
-
Cullen, A.L.1
Yu, P.K.2
-
46
-
-
0016945818
-
Precise dielectric measurements at 35 GHz using a microwave open-resonator
-
0020-3270
-
Jones R G 1976 Precise dielectric measurements at 35 GHz using a microwave open-resonator Proc. IEE 123 285-90
-
(1976)
Proc. IEE
, vol.123
, pp. 285-290
-
-
Jones, R.G.1
-
47
-
-
0019897013
-
Fabry-Perot and open resonators at microwave and millimeter wave frequencies, 2-300 GHz
-
0022-3735 002
-
Clarke R N and Rosenberg C B 1982 Fabry-Perot and open resonators at microwave and millimeter wave frequencies, 2-300 GHz J. Phys. E: Sci. Instrum. 15 9-24
-
(1982)
J. Phys. E: Sci. Instrum.
, vol.15
, Issue.1
, pp. 9-24
-
-
Clarke, R.N.1
Rosenberg, C.B.2
-
49
-
-
0026927732
-
Open resonators: Improvement of confidence in measurement of loss
-
0143-702X A
-
Lynch A C and Clarke R N 1992 Open resonators: improvement of confidence in measurement of loss IEEE Proc. A 139 221-5
-
(1992)
IEEE Proc.
, vol.139
, pp. 221-225
-
-
Lynch, A.C.1
Clarke, R.N.2
-
51
-
-
0036627423
-
CVD diamond windows studied with low- and high-power millimeter waves
-
10.1109/TPS.2002.801558 0093-3813
-
Heidinger R, Dammertz G, Meiera A and Thumm M K 2002 CVD diamond windows studied with low- and high-power millimeter waves IEEE Trans. Plasma Sci. 30 800-7
-
(2002)
IEEE Trans. Plasma Sci.
, vol.30
, Issue.3
, pp. 800-807
-
-
Heidinger, R.1
Dammertz, G.2
Meiera, A.3
Thumm, M.K.4
-
52
-
-
0041689546
-
New approach for open resonator analysis for dielectric measurements at millimeter wavelengths
-
10.1016/S0955-2219(03)00140-7 0955-2219
-
Danilov I and Heidinger R 2003 New approach for open resonator analysis for dielectric measurements at millimeter wavelengths J. Eur. Ceram. Soc. 23 2623-6
-
(2003)
J. Eur. Ceram. Soc.
, vol.23
, Issue.14
, pp. 2623-2626
-
-
Danilov, I.1
Heidinger, R.2
-
54
-
-
0022734215
-
Electromagnetic analysis of spherical dielectric shielded resonators
-
10.1109/TMTT.1986.1133423 0018-9480
-
Julien A and Guillon P 1986 Electromagnetic analysis of spherical dielectric shielded resonators IEEE Trans. Microw. Theory Tech. 34 723-29
-
(1986)
IEEE Trans. Microw. Theory Tech.
, vol.34
, Issue.6
, pp. 723-729
-
-
Julien, A.1
Guillon, P.2
-
57
-
-
27644499470
-
High Q-factor microwave Fabry-Perot resonator with distributed Bragg reflectors
-
10.1109/TUFFC.2005.1516015 0885-3010
-
Krupka J, Cwikla A, Mrozowski M, Clarke R N and Tobar M E 2005 High Q-factor microwave Fabry-Perot resonator with distributed Bragg reflectors IEEE Trans. Ultrason. Ferroelectr. Freq. Control 52 1443-51
-
(2005)
IEEE Trans. Ultrason. Ferroelectr. Freq. Control
, vol.52
, Issue.9
, pp. 1443-1451
-
-
Krupka, J.1
Cwikla, A.2
Mrozowski, M.3
Clarke, R.N.4
Tobar, M.E.5
-
58
-
-
84928809109
-
A dielectric resonator method of measuring inductive capacities in the millimeter range
-
10.1109/TMTT.1960.1124749 0018-9480
-
Hakki B W and Coleman P D 1960 A dielectric resonator method of measuring inductive capacities in the millimeter range IEEE Trans. Microw. Theory Tech. 8 402-10
-
(1960)
IEEE Trans. Microw. Theory Tech.
, vol.8
, Issue.4
, pp. 402-410
-
-
Hakki, B.W.1
Coleman, P.D.2
-
59
-
-
0014829002
-
Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators
-
10.1109/TMTT.1970.1127271 0018-9480
-
Courtney W E 1970 Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators IEEE Trans. Microw. Theory Tech. 18 476-85
-
(1970)
IEEE Trans. Microw. Theory Tech.
, vol.18
, Issue.8
, pp. 476-485
-
-
Courtney, W.E.1
-
61
-
-
0022100780
-
Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method
-
10.1109/TMTT.1985.1133033 0018-9480
-
Kobayashi Y and Katoh M 1985 Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method IEEE Trans. Microw. Theory Tech. 33 586-92
-
(1985)
IEEE Trans. Microw. Theory Tech.
, vol.33
, Issue.7
, pp. 586-592
-
-
Kobayashi, Y.1
Katoh, M.2
-
63
-
-
0027656569
-
Surface resistance measurements of HTS films by means of sapphire dielectric resonators
-
10.1109/77.234839 1051-8223
-
Krupka J, Klinger M, Kuhn M, Baranyak A, Stiller M, Hinken J and Modelski J 1993 Surface resistance measurements of HTS films by means of sapphire dielectric resonators IEEE Trans. Appl. Supercond. 3 3043-8
-
(1993)
IEEE Trans. Appl. Supercond.
, vol.3
, Issue.3
, pp. 3043-3048
-
-
Krupka, J.1
Klinger, M.2
Kuhn, M.3
Baranyak, A.4
Stiller, M.5
Hinken, J.6
Modelski, J.7
-
65
-
-
0032183775
-
A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature
-
0957-0233 015
-
Krupka J, Derzakowski K, Riddle B and Baker-Jarvis J 1998 A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature Meas. Sci. Technol. 9 1751-6
-
(1998)
Meas. Sci. Technol.
, vol.9
, Issue.10
, pp. 1751-1756
-
-
Krupka, J.1
Derzakowski, K.2
Riddle, B.3
Baker-Jarvis, J.4
-
66
-
-
24144438185
-
Complex permittivity measurements of low loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample
-
0957-0233 014
-
Krupka J, Huang W-T and Tung M-J 2005 Complex permittivity measurements of low loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample Meas. Sci. Technol. 16 1014-20
-
(2005)
Meas. Sci. Technol.
, vol.16
, Issue.4
, pp. 1014-1020
-
-
Krupka, J.1
Huang, W.-T.2
Tung, M.-J.3
-
67
-
-
0028127618
-
Study of whispering gallery modes in anisotropic single crystal dielectric resonators
-
10.1109/22.265528 0018-9480
-
Krupka J, Cros D, Aubourg M and Guillon P 1994 Study of whispering gallery modes in anisotropic single crystal dielectric resonators IEEE Trans. Microw. Theory Tech. 42 56-61
-
(1994)
IEEE Trans. Microw. Theory Tech.
, vol.42
, Issue.1
, pp. 56-61
-
-
Krupka, J.1
Cros, D.2
Aubourg, M.3
Guillon, P.4
-
68
-
-
0033359335
-
Whispering gallery modes for complex permittivity measurements of ultra-low loss dielectric materials
-
10.1109/22.769347 0018-9480
-
Krupka J, Derzakowski K, Abramowicz A, Tobar M E and Geyer R G 1999 Whispering gallery modes for complex permittivity measurements of ultra-low loss dielectric materials IEEE Trans. Microw. Theory Tech. 47 752-9
-
(1999)
IEEE Trans. Microw. Theory Tech.
, vol.47
, Issue.6
, pp. 752-759
-
-
Krupka, J.1
Derzakowski, K.2
Abramowicz, A.3
Tobar, M.E.4
Geyer, R.G.5
-
69
-
-
0000429168
-
Experimental observation of fundamental microwave absorption in high quality dielectric crystals
-
10.1016/0375-9601(87)90676-1 0375-9601 A
-
Braginsky V, Ilchenko V S and Bagdassarov Kh S 1987 Experimental observation of fundamental microwave absorption in high quality dielectric crystals Phys. Lett. A 120 300-5
-
(1987)
Phys. Lett.
, vol.120
, Issue.6
, pp. 300-305
-
-
Braginsky, V.1
Ilchenko, V.S.2
Bagdassarov, Kh.S.3
-
70
-
-
0032679901
-
Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures
-
0957-0233 308
-
Krupka J, Derzakowski K, Tobar M E, Hartnett J and Geyer R G 1999 Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures Meas. Sci. Technol. 10 387-92
-
(1999)
Meas. Sci. Technol.
, vol.10
, Issue.5
, pp. 387-392
-
-
Krupka, J.1
Derzakowski, K.2
Tobar, M.E.3
Hartnett, J.4
Geyer, R.G.5
-
72
-
-
0026185691
-
Measurements of all permeability tensor components and the effective linewidth of microwave ferrites using dielectric ring resonators
-
10.1109/22.85382 0018-9480
-
Krupka J 1991 Measurements of all permeability tensor components and the effective linewidth of microwave ferrites using dielectric ring resonators IEEE Trans. Microw. Theory Tech. 39 1148-57
-
(1991)
IEEE Trans. Microw. Theory Tech.
, vol.39
, Issue.7
, pp. 1148-1157
-
-
Krupka, J.1
-
74
-
-
0006776722
-
01δ mode dielectric resonator for the complex permittivity measurements of semiconductors
-
01δ mode dielectric resonator for the complex permittivity measurements of semiconductors CPEM'86 Conf. Dig. pp 154-5
-
(1986)
CPEM'86 Conf. Dig.
, pp. 154-155
-
-
Krupka, J.1
Maj, S.2
-
76
-
-
0002173701
-
Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques
-
Krupka J, Geyer R G, Baker-Jarvis J and Ceremuga J 1996 Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques DMMA'96 Conf. Dig. pp 21-4
-
(1996)
DMMA'96 Conf. Dig.
, pp. 21-24
-
-
Krupka, J.1
Geyer, R.G.2
Baker-Jarvis, J.3
Ceremuga, J.4
-
77
-
-
0035204925
-
Uncertainty of complex permittivity measurements by split-post dielectric resonator technique
-
10.1016/S0955-2219(01)00343-0 0955-2219
-
Krupka J, Gregory A P, Rochard O C, Clarke R N, Riddle B and Baker-Jarvis J 2001 Uncertainty of complex permittivity measurements by split-post dielectric resonator technique J. Eur. Ceram. Soc. 21 2673-6
-
(2001)
J. Eur. Ceram. Soc.
, vol.21
, Issue.15
, pp. 2673-2676
-
-
Krupka, J.1
Gregory, A.P.2
Rochard, O.C.3
Clarke, R.N.4
Riddle, B.5
Baker-Jarvis, J.6
-
78
-
-
0033295263
-
Comparison of split-post dielectric resonator and ferrite disk resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet
-
0957-0233 305
-
Krupka J, Gabelich S A, Derzakowski K and Pierce B M 1999 Comparison of split-post dielectric resonator and ferrite disk resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet Meas. Sci. Technol. 10 1004-8
-
(1999)
Meas. Sci. Technol.
, vol.10
, Issue.11
, pp. 1004-1008
-
-
Krupka, J.1
Gabelich, S.A.2
Derzakowski, K.3
Pierce, B.M.4
-
79
-
-
33746855484
-
Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator
-
Krupka J, Huang W T and Tung M J 2005 Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator 11th Int. Meeting on Ferroelectricity (Foz do Iguacu, Brazil, 5-9 Sept. 2005)
-
(2005)
11th Int. Meeting on Ferroelectricity
-
-
Krupka, J.1
Huang, W.T.2
Tung, M.J.3
-
80
-
-
0030081001
-
Nondestructive permittivity measurements of substrates
-
10.1109/19.481319 0018-9456
-
Kent G 1996 Nondestructive permittivity measurements of substrates IEEE Trans. Instrum. Meas. 45 102-6
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.1
, pp. 102-106
-
-
Kent, G.1
-
81
-
-
0033316914
-
Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements
-
10.1109/22.795077 0018-9480
-
Janezic M D and Baker-Jarvis J 1999 Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements IEEE Trans. Microw. Theory Tech. 47 2014-20
-
(1999)
IEEE Trans. Microw. Theory Tech.
, vol.47
, Issue.10
, pp. 2014-2020
-
-
Janezic, M.D.1
Baker-Jarvis, J.2
-
82
-
-
33646866653
-
Non-destructive permittivity measurements of dielectric substrates using split-cylinder and split-post resonators
-
Janezic M D, Krupka J and Baker-Jarvis J 2001 Non-destructive permittivity measurements of dielectric substrates using split-cylinder and split-post resonators Dig. of Int. Conf. APTADM'2001 pp 116-8
-
(2001)
Dig. of Int. Conf. APTADM'2001
, pp. 116-118
-
-
Janezic, M.D.1
Krupka, J.2
Baker-Jarvis, J.3
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