Improved coaxial probe technique for measuring microwave permittivity of thin dielectric materials

Measurement Science and Technology

Volumn 11, Issue 11, 2000, Pages 1617-1622

  Wu, Mingzhong ^a   Yao, Xi ^a   Zhang, Liangying ^a  

^a TONGJI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYSIS; MEASUREMENT THEORY; PROBES;

COAXIAL PROBES; COMPLEX PERMITTIVITY; MICROWAVE PERMITTIVITY;

MICROWAVE MEASUREMENT;

EID: 0034319311     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/11/311     Document Type: Article

References (25)