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Volumn 305, Issue 1-3, 2002, Pages 1-9
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Dielectric spectroscopy - Yesterday, today and tomorrow
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
GLASS TRANSITION;
MOLECULAR DYNAMICS;
SPECTROSCOPIC ANALYSIS;
THERMAL EXPANSION;
DIELECTRIC THERMAL EXPANSION SPECTROSCOPY;
DIELECTRIC RELAXATION;
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EID: 0036642698
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(02)01083-9 Document Type: Conference Paper |
Times cited : (177)
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References (29)
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