-
1
-
-
33646867637
-
Frequency domain complex permittivity measurements at microwave frequencies
-
Krupka J 2006 Frequency domain complex permittivity measurements at microwave frequencies Meas. Sci. Technol. 17 R55-70
-
(2006)
Meas. Sci. Technol.
, vol.17
, Issue.6
-
-
Krupka, J.1
-
2
-
-
34047242785
-
-
Baker-Jarvis J, Janezic M D, Riddle B F, Johnk R T, Kabos P, Holloway C L, Geyer R G and Grosvenor C A Measuring the permittivity and permeability of lossy materials: solids, liquids, metals, building materials, and negative-index materials NIST Technical Note 1536
-
Measuring the Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-index Materials
-
-
Baker-Jarvis, J.1
Janezic, M.D.2
Riddle, B.F.3
Johnk, R.T.4
Kabos, P.5
Holloway, C.L.6
Geyer, R.G.7
Grosvenor, C.A.8
-
5
-
-
34247250743
-
Resonance methods for microwave studies of dielectrics (review)
-
Egorov V N 2007 Resonance methods for microwave studies of dielectrics (review) Instrum. Exp. Tech. 50 143-75
-
(2007)
Instrum. Exp. Tech.
, vol.50
, Issue.2
, pp. 143-175
-
-
Egorov, V.N.1
-
7
-
-
0025474631
-
Improved technique for determining complex permittivity with the transmission/reflection method
-
Baker-Jarvis J, Vanzura E J and Kissick W A 1990 Improved technique for determining complex permittivity with the transmission/reflection method IEEE Trans. Microw. Theory Tech. 38 1096-103
-
(1990)
IEEE Trans. Microw. Theory Tech.
, vol.38
, Issue.8
, pp. 1096-1103
-
-
Baker-Jarvis, J.1
Vanzura, E.J.2
Kissick, W.A.3
-
9
-
-
0020720426
-
A fast computational technique for accurate permittivity determination using transmission line methods
-
Ligthart L P 1983 A fast computational technique for accurate permittivity determination using transmission line methods IEEE Trans. Microw. Theory Tech. 31 249-54
-
(1983)
IEEE Trans. Microw. Theory Tech.
, vol.83
, Issue.3
, pp. 249-254
-
-
Ligthart, L.P.1
-
10
-
-
0014882762
-
Measurement of the intrinsic properties of materials by time-domain techniques
-
Nicolson A M and Ross G F 1970 Measurement of the intrinsic properties of materials by time-domain techniques IEEE Trans. Instrum. Meas. 19 377-82
-
(1970)
IEEE Trans. Instrum. Meas.
, vol.19
, Issue.4
, pp. 377-382
-
-
Nicolson, A.M.1
Ross, G.F.2
-
11
-
-
0015980602
-
Automatic measurement of complex dielectric constant and permeability at microwave frequencies
-
Weir W B 1974 Automatic measurement of complex dielectric constant and permeability at microwave frequencies Proc. IEEE 62 33-6
-
(1974)
Proc. IEEE
, vol.62
, Issue.1
, pp. 33-36
-
-
Weir, W.B.1
-
12
-
-
0028546976
-
Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines
-
Vanzura E J, Baker-Jarvis J R, Grosvenor J H and Janezic M D 1994 Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines IEEE Trans. Microw. Theory Tech. 42 2063-70
-
(1994)
IEEE Trans. Microw. Theory Tech.
, vol.42
, Issue.11
, pp. 2063-2070
-
-
Vanzura, E.J.1
Baker-Jarvis, J.R.2
Grosvenor, J.H.3
Janezic, M.D.4
-
13
-
-
0023437613
-
Dielectric measurements of package materials in an inhomogeneously filled rectangular waveguide
-
Dube D C, Lanagan M T and Jang S J 1987 Dielectric measurements of package materials in an inhomogeneously filled rectangular waveguide J. Am. Ceram. Soc. 70 C278-80
-
(1987)
J. Am. Ceram. Soc.
, vol.70
, Issue.10
-
-
Dube, D.C.1
Lanagan, M.T.2
Jang, S.J.3
-
14
-
-
0037251035
-
Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides
-
Catala-Civera J M, Canos A J, Penaranda-Foix F L and De Los Reyes Davo E 2003 Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides IEEE Trans. Microw. Theory Tech. 51 16-24
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.1
, pp. 16-24
-
-
Catala-Civera, J.M.1
Canos, A.J.2
Penaranda-Foix, F.L.3
De Los Reyes Davo, E.4
-
15
-
-
0023994874
-
Microwave dielectric properties of antiferroelectric lead zirconate
-
Lanagan M T, Kim J H, Jang S J and Newnham R E 1988 Microwave dielectric properties of antiferroelectric lead zirconate J. Am. Ceram. Soc. 71 311-6
-
(1988)
J. Am. Ceram. Soc.
, vol.71
, Issue.4
, pp. 311-316
-
-
Lanagan, M.T.1
Kim, J.H.2
Jang, S.J.3
Newnham, R.E.4
-
16
-
-
84948867906
-
A microwave dielectric measurement technique for high permittivity materials
-
Lanagan M T, Kim J H, Dube D C, Jang S J and Newnham R E 1988 A microwave dielectric measurement technique for high permittivity materials Ferroelectrics 82 91-7
-
(1988)
Ferroelectrics
, vol.82
, pp. 91-97
-
-
Lanagan, M.T.1
Kim, J.H.2
Dube, D.C.3
Jang, S.J.4
Newnham, R.E.5
-
17
-
-
36849141776
-
2) at microwave frequencies between 4.2 and 300 K
-
2) at microwave frequencies between 4.2 and 300 K J. Appl. Phys. 33 1450-3
-
(1962)
J. Appl. Phys.
, vol.33
, Issue.4
, pp. 1450-1453
-
-
Sabisky, E.S.1
Gerritsen, H.J.2
-
19
-
-
0037664382
-
Simultaneous measurement of permittivity and permeability of lossy sheet using flanged rectangular waveguide
-
Hayashi Y, Mishima G, Hirayama K and Hayashi Y 2003 Simultaneous measurement of permittivity and permeability of lossy sheet using flanged rectangular waveguide Electron. Commun. Japan, Part II: Electronics 86 32-41
-
(2003)
Electron. Commun. Japan, Part II: Electronics
, vol.86
, Issue.7
, pp. 32-41
-
-
Hayashi, Y.1
Mishima, G.2
Hirayama, K.3
Hayashi, Y.4
-
20
-
-
33645661438
-
Permittivity measurement of low and high loss liquids in the frequency range of 8 to 40 GHz using waveguide transmission line technique
-
Afsar M N, Suwanvisan N and Wang Y 2006 Permittivity measurement of low and high loss liquids in the frequency range of 8 to 40 GHz using waveguide transmission line technique Microw. Opt. Tech. Lett. 48 275-81
-
(2006)
Microw. Opt. Tech. Lett.
, vol.48
, Issue.2
, pp. 275-281
-
-
Afsar, M.N.1
Suwanvisan, N.2
Wang, Y.3
-
21
-
-
0016038442
-
Permittivity measurements at microwave frequencies using lumped elements
-
Stuchly S S, Pzepecka M A and Iskander M F 1974 Permittivity measurements at microwave frequencies using lumped elements IEEE Trans. Instrum. Meas. 23 56-62
-
(1974)
IEEE Trans. Instrum. Meas.
, vol.23
, Issue.1
, pp. 56-62
-
-
Stuchly, S.S.1
Pzepecka, M.A.2
Iskander, M.F.3
-
22
-
-
0016484948
-
A lumped capacitance method for the measurement of the permittivity and conductivity in the frequency and time domain-a further analysis
-
Pzepecka M A and Stuchly S S 1975 A lumped capacitance method for the measurement of the permittivity and conductivity in the frequency and time domain-a further analysis IEEE Trans. Instrum. Meas. 24 27-32
-
(1975)
IEEE Trans. Instrum. Meas.
, vol.24
, Issue.1
, pp. 27-32
-
-
Pzepecka, M.A.1
Stuchly, S.S.2
-
23
-
-
0017950724
-
Fringing field effect in the lumped-capacitance method for permittivity measurement
-
Iskander M F and Stuchly S S 1978 Fringing field effect in the lumped-capacitance method for permittivity measurement IEEE Trans. Instrum. Meas. 27 107-9
-
(1978)
IEEE Trans. Instrum. Meas.
, vol.27
, Issue.1
, pp. 107-109
-
-
Iskander, M.F.1
Stuchly, S.S.2
-
24
-
-
0022683047
-
Parallel-plate coaxial sensor for dielectric measurements-further analysis
-
Anderson L, Stuchly S S and Gajda G B 1986 Parallel-plate coaxial sensor for dielectric measurements-further analysis IEEE Trans. Instrum. Meas. 35 89-91
-
(1986)
IEEE Trans. Instrum. Meas.
, vol.35
, pp. 89-91
-
-
Anderson, L.1
Stuchly, S.S.2
Gajda, G.B.3
-
25
-
-
13444267608
-
Study of microwave dielectric properties measurements by various resonance techniques
-
Sheen J 2005 Study of microwave dielectric properties measurements by various resonance techniques Measurement 37 123-30
-
(2005)
Measurement
, vol.37
, Issue.2
, pp. 123-130
-
-
Sheen, J.1
-
27
-
-
0032794970
-
Characterization of high-Q resonators for microwave-filter applications
-
Kwok R S and Liang J F 1999 Characterization of high-Q resonators for microwave-filter applications IEEE Trans. Microw. Theory Tech. 47 111-4
-
(1999)
IEEE Trans. Microw. Theory Tech.
, vol.47
, Issue.1
, pp. 111-114
-
-
Kwok, R.S.1
Liang, J.F.2
-
28
-
-
0022100780
-
Microwave measurement of dielectric properties of low-loss materials by the dielectric rod method
-
Kobayashi Y and Katoh M 1985 Microwave measurement of dielectric properties of low-loss materials by the dielectric rod method IEEE Trans. Microw. Theory Tech. 33 586-92
-
(1985)
IEEE Trans. Microw. Theory Tech.
, vol.33
, Issue.7
, pp. 586-592
-
-
Kobayashi, Y.1
Katoh, M.2
-
29
-
-
0022244659
-
A novel method for characterizing the surface resistance of two conducting plates shorted at both ends of a dielectric resonators
-
Xu D and Li Z 1985 A novel method for characterizing the surface resistance of two conducting plates shorted at both ends of a dielectric resonators 15th European Microwave Conf. Proc. pp 912-6
-
(1985)
15th European Microwave Conf. Proc.
, pp. 912-916
-
-
Xu, D.1
Li, Z.2
-
30
-
-
84928809109
-
A dielectric resonator method of measuring inductive capacities in the millimeter range
-
Hakki B W and Coleman P D 1960 A dielectric resonator method of measuring inductive capacities in the millimeter range IRE Trans. Microw. Theory Tech. 8 402-10
-
(1960)
IRE Trans. Microw. Theory Tech.
, vol.8
, Issue.4
, pp. 402-410
-
-
Hakki, B.W.1
Coleman, P.D.2
-
31
-
-
0014829002
-
Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators
-
Courtney W E 1970 Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators IEEE Trans. Microw. Theory Tech. 18 476-85
-
(1970)
IEEE Trans. Microw. Theory Tech.
, vol.18
, Issue.8
, pp. 476-485
-
-
Courtney, W.E.1
-
32
-
-
84956102400
-
Low temperature properties of microwave dielectrics
-
Tamura H, Hatsumoto H and Wakino K 1989 Low temperature properties of microwave dielectrics Japan. J. Appl. Phys. 28 (Suppl. 28-2) 21-3
-
(1989)
Japan. J. Appl. Phys.
, vol.28
, Issue.2 SUPPL. 28
, pp. 21-23
-
-
Tamura, H.1
Hatsumoto, H.2
Wakino, K.3
-
34
-
-
9244260520
-
An efficient volume integral equation approach for characterization of lossy dielectric materials
-
Lui M L and Wu K L 2004 An efficient volume integral equation approach for characterization of lossy dielectric materials IEEE Trans. Microw. Theory Tech. MTT-52 2464-73
-
(2004)
IEEE Trans. Microw. Theory Tech.
, vol.52
, Issue.11
, pp. 2464-2473
-
-
Lui, M.L.1
Wu, K.L.2
-
35
-
-
0036018346
-
Anisotropic disk dielectric resonator with conducting end faces
-
Prokopenko Yu V and Filipov Yu F 2002 Anisotropic disk dielectric resonator with conducting end faces Tech. Phys. 47 731-6
-
(2002)
Tech. Phys.
, vol.47
, Issue.6
, pp. 731-736
-
-
Prokopenko Yu, V.1
Filipov Yu, F.2
-
36
-
-
0038178227
-
Q factor of a millimeter-wave sapphire disk resonator with conductive end plates
-
Barannik A A, Prokopenko Yu V, Filipov Yu F, Cherpak N T and Korotash I V 2003 Q factor of a millimeter-wave sapphire disk resonator with conductive end plates Tech. Phys. 48 621-5
-
(2003)
Tech. Phys.
, vol.48
, Issue.5
, pp. 621-625
-
-
Barannik, A.A.1
Prokopenko Yu, V.2
Filipov Yu, F.3
Cherpak, N.T.4
Korotash, I.V.5
-
37
-
-
0346503989
-
Resonance characteristics of whispering gallery modes in parallel-plates-type cylindrical dielectric resonators
-
Akay M F, Prokopenko Yu and Kharkovsky S 2004 Resonance characteristics of whispering gallery modes in parallel-plates-type cylindrical dielectric resonators Microw. Opt. Tech. Lett. 40 96-101
-
(2004)
Microw. Opt. Tech. Lett.
, vol.40
, Issue.2
, pp. 96-101
-
-
Akay, M.F.1
Yu, P.2
Kharkovsky, S.3
-
38
-
-
0041974594
-
Accurate microwave technique of surface resistance measurement of large-area HTS films using sapphire quasioptical resonator
-
Cherpak N T, Barannik A A, Prokopenko Yu V, Filipov Yu F and Vitusevich S 2003 Accurate microwave technique of surface resistance measurement of large-area HTS films using sapphire quasioptical resonator IEEE Trans. Appl. Supercond. 13 3570-3
-
(2003)
IEEE Trans. Appl. Supercond.
, vol.13
, Issue.2
, pp. 3570-3573
-
-
Cherpak, N.T.1
Barannik, A.A.2
Prokopenko Yu, V.3
Filipov Yu, F.4
Vitusevich, S.5
-
39
-
-
0017551958
-
Accurate resonant frequencies of dielectric resonators
-
Guillon P and Garault Y 1977 Accurate resonant frequencies of dielectric resonators IEEE Trans. Microw. Theory Tech. MTT-25 916-22
-
(1977)
IEEE Trans. Microw. Theory Tech.
, vol.25
, Issue.11
, pp. 916-922
-
-
Guillon, P.1
Garault, Y.2
-
40
-
-
0035204925
-
Uncertainty of complex permittivity measurements by split-post dielectric resonator technique
-
Krupka J, Gregory A P, Rochard O C, Clarke R N, Riddle B and Baker-Jarvis J 2001 Uncertainty of complex permittivity measurements by split-post dielectric resonator technique J. Eur. Ceram. Soc. 21 2673-6
-
(2001)
J. Eur. Ceram. Soc.
, vol.21
, Issue.15
, pp. 2673-2676
-
-
Krupka, J.1
Gregory, A.P.2
Rochard, O.C.3
Clarke, R.N.4
Riddle, B.5
Baker-Jarvis, J.6
-
41
-
-
0023995910
-
Properties of shielded cylindrical quasi- TE0nm-mode dielectric resonators
-
Krupka J 1988 Properties of shielded cylindrical quasi- TE0nm-mode dielectric resonators IEEE Trans. Microw. Theory Tech. MTT-36 774-9
-
(1988)
IEEE Trans. Microw. Theory Tech.
, vol.36
, Issue.4
, pp. 774-779
-
-
Krupka, J.1
-
42
-
-
0032183775
-
A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature
-
Krupka J, Derzakowski K, Riddle B and Baker-Jarvis J 1998 A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature Meas. Sci. Technol. 9 1751-6
-
(1998)
Meas. Sci. Technol.
, vol.9
, Issue.10
, pp. 1751-1756
-
-
Krupka, J.1
Derzakowski, K.2
Riddle, B.3
Baker-Jarvis, J.4
-
43
-
-
24144438185
-
Complex permittivity measurements of low loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample
-
Krupka J, Huang W-T and Tung M-J 2005 Complex permittivity measurements of low loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample Meas. Sci. Technol. 16 1014-20
-
(2005)
Meas. Sci. Technol.
, vol.16
, Issue.4
, pp. 1014-1020
-
-
Krupka, J.1
Huang, W.-T.2
Tung, M.-J.3
-
44
-
-
35348895806
-
Microwave measurements of dielectric properties using a closed cylindrical cavity resonator
-
Sheen J 2007 Microwave measurements of dielectric properties using a closed cylindrical cavity resonator IEEE Trans. Dielectr. Electr. Insul. 14 1139-44
-
(2007)
IEEE Trans. Dielectr. Electr. Insul.
, vol.14
, Issue.5
, pp. 1139-1144
-
-
Sheen, J.1
-
47
-
-
34648834014
-
Microwave dielectric properties measurements using the waveguide reflection dielectric resonator
-
Sheen J 2007 Microwave dielectric properties measurements using the waveguide reflection dielectric resonator Proc IEEE Instrumentation and Measurement Technology Conf., IMTC (Warsaw, Poland, 1-3 May) pp 1-4
-
(2007)
Proc IEEE Instrumentation and Measurement Technology Conf., IMTC
, pp. 1-4
-
-
Sheen, J.1
-
48
-
-
85034780764
-
-
Split post dielectric resonators for dielectric measurements of substrates Agilent Application Note 5989-5384EN
-
Split post dielectric resonators for dielectric measurements of substrates Agilent Application Note 5989-5384EN
-
-
-
-
49
-
-
0033295263
-
Comparison of split post dielectric resonator and ferrite disc resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet
-
Krupka J, Gabelich S A, Derzakowski K and Pierce B M 1999 Comparison of split post dielectric resonator and ferrite disc resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet Meas. Sci. Technol. 10 1004-8
-
(1999)
Meas. Sci. Technol.
, vol.10
, Issue.11
, pp. 1004-1008
-
-
Krupka, J.1
Gabelich, S.A.2
Derzakowski, K.3
Pierce, B.M.4
-
50
-
-
4544386472
-
Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators
-
Mazierska J, Krupka J, Jacob M V and Ledenyov D 2004 Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators IEEE MTT-S Int. Microw. Symp. Digest vol 3 pp 1825-8
-
(2004)
IEEE MTT-S Int. Microw. Symp. Digest
, vol.3
, pp. 1825-1828
-
-
Mazierska, J.1
Krupka, J.2
Jacob, M.V.3
Ledenyov, D.4
-
51
-
-
34547196863
-
Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies
-
Sheen J 2007 Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies J. Appl. Phys. 102 014102
-
(2007)
J. Appl. Phys.
, vol.102
, Issue.1
, pp. 014102
-
-
Sheen, J.1
-
52
-
-
33846459231
-
Dielectric measurements on substrates materials at microwave frequencies using cavity perturbation technique
-
Dube D C, Lanagan L T, Kim J H and Jang S J 1988 Dielectric measurements on substrates materials at microwave frequencies using cavity perturbation technique J. Appl. Phys. 63 2466-8
-
(1988)
J. Appl. Phys.
, vol.63
, Issue.7
, pp. 2466-2468
-
-
Dube, D.C.1
Lanagan, L.T.2
Kim, J.H.3
Jang, S.J.4
-
53
-
-
2542451690
-
Measurement of microwave dielectric constants of ferroelectrics
-
Nakamura E and Furuichi J 1960 Measurement of microwave dielectric constants of ferroelectrics J. Phys. Soc. Japan. 15 1955-60
-
(1960)
J. Phys. Soc. Japan.
, vol.15
, Issue.11
, pp. 1955-1960
-
-
Nakamura, E.1
Furuichi, J.2
-
54
-
-
0024680633
-
Dielectric properties of microporous glass in the microwave region
-
Yamamoto J K, Lanagan M T, Bhalla A S, Newnham R E and Cross L E 1989 Dielectric properties of microporous glass in the microwave region J. Am. Ceram. Soc. 72 916-21
-
(1989)
J. Am. Ceram. Soc.
, vol.72
, Issue.6
, pp. 916-921
-
-
Yamamoto, J.K.1
Lanagan, M.T.2
Bhalla, A.S.3
Newnham, R.E.4
Cross, L.E.5
-
55
-
-
0026852512
-
New results for coaxial re-entrant cavity with partially dielectric filled gap
-
Xi W, Tinga W R, Voss W A G and Tian B Q 1992 New results for coaxial re-entrant cavity with partially dielectric filled gap IEEE Trans. Microw. Theory Tech. 40 747-53
-
(1992)
IEEE Trans. Microw. Theory Tech.
, vol.40
, Issue.4
, pp. 747-753
-
-
Xi, W.1
Tinga, W.R.2
Voss, W.A.G.3
Tian, B.Q.4
-
57
-
-
0000339528
-
Reentrant radio-frequency resonator for automated phase-equilibria and dielectric measurements in fluids
-
Goodwin A R H, Mehl J B and Moldover M R 1996 Reentrant radio-frequency resonator for automated phase-equilibria and dielectric measurements in fluids Rev. Sci. Instrum. 67 4292-303
-
(1996)
Rev. Sci. Instrum.
, vol.67
, Issue.12
, pp. 4294-4303
-
-
Goodwin, A.R.H.1
Mehl, J.B.2
Moldover, M.R.3
-
60
-
-
0034217724
-
Resonant frequency analysis of reentrant resonant cavity applicator by using FEM and FD-TD method
-
Kanai T, Tsukamoto T, Miyakawa M and Kashiwa T 2000 Resonant frequency analysis of reentrant resonant cavity applicator by using FEM and FD-TD method IEEE Trans. Magn. 36 1750-3
-
(2000)
IEEE Trans. Magn.
, vol.36
, Issue.4
, pp. 1750-1753
-
-
Kanai, T.1
Tsukamoto, T.2
Miyakawa, M.3
Kashiwa, T.4
-
62
-
-
0018995257
-
High-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: Part A-theoretical analysis of the method
-
Kaczkowski A and Milewski A 1980 High-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: part A-theoretical analysis of the method IEEE Trans. Microw. Theory Tech. 28 225-8
-
(1980)
IEEE Trans. Microw. Theory Tech.
, vol.28
, Issue.3
, pp. 225-228
-
-
Kaczkowski, A.1
Milewski, A.2
-
63
-
-
1542280911
-
High-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: Part B-experimental analysis of measurement error
-
Kaczkowski A and Milewski A 1980 High-accuracy wide-range measurement method for determination of complex permittivity in reentrant cavity: part B-experimental analysis of measurement error IEEE Trans. Microwave Theory Tech. 28 228-31
-
(1980)
IEEE Trans. Microwave Theory Tech.
, vol.28
, Issue.3
, pp. 228-231
-
-
Kaczkowski, A.1
Milewski, A.2
-
64
-
-
36749109910
-
New cavity perturbation technique for microwave measurement of dielectric constant
-
Sen S, Saha P K and Nag B R 1979 New cavity perturbation technique for microwave measurement of dielectric constant Rev. Sci. Instrum. 50 1594-7
-
(1979)
Rev. Sci. Instrum.
, vol.50
, Issue.12
, pp. 1594-1597
-
-
Sen, S.1
Saha, P.K.2
Nag, B.R.3
-
67
-
-
34547203463
-
Measurement, uncertainty, traceability, and the GUM
-
Ridler N, Lee B, Martens J and Wang K 2007 Measurement, uncertainty, traceability, and the GUM IEEE Microw. Mag. 8 44-53
-
(2007)
IEEE Microw. Mag.
, vol.8
, Issue.4
, pp. 44-53
-
-
Ridler, N.1
Lee, B.2
Martens, J.3
Wang, K.4
-
68
-
-
0026105180
-
Microwave measurement of the dielectric constant of high-density polyethylene
-
Seeger K 1991 Microwave measurement of the dielectric constant of high-density polyethylene IEEE Trans. Microw. Theory Tech. 39 352-4
-
(1991)
IEEE Trans. Microw. Theory Tech.
, vol.39
, Issue.2
, pp. 352-354
-
-
Seeger, K.1
-
69
-
-
0037359828
-
Complex permittivity measurements of common plastics over variable temperatures
-
Riddle B, Baker-Jarvis J and Krupka J 2003 Complex permittivity measurements of common plastics over variable temperatures IEEE Trans. Microw. Theory Tech. 51 727-33
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.3
, pp. 727-733
-
-
Riddle, B.1
Baker-Jarvis, J.2
Krupka, J.3
-
71
-
-
0027644451
-
Dielectric property measurement system at cryogenic temperatures and microwave frequencies
-
Molla J, Ibarra A, Margineda J, Zamarro J M and Hernandez A 1993 Dielectric property measurement system at cryogenic temperatures and microwave frequencies IEEE Trans. Instrum. Meas. 42 817-21
-
(1993)
IEEE Trans. Instrum. Meas.
, vol.42
, Issue.4
, pp. 817-821
-
-
Molla, J.1
Ibarra, A.2
Margineda, J.3
Zamarro, J.M.4
Hernandez, A.5
-
74
-
-
0038624970
-
3 ceramics with temperature-stable high dielectric constant and low microwave loss
-
3 ceramics with temperature-stable high dielectric constant and low microwave loss Japan. J. Appl. Phys. 21 624-6
-
(1982)
Japan. J. Appl. Phys.
, vol.21
, Issue.PART 2
, pp. 624-626
-
-
Nomura, S.1
Toyama, K.2
Kaneta, K.3
-
75
-
-
0042993997
-
3 ceramics sintered at low-temperatures
-
3 ceramics sintered at low-temperatures Mater. Eng. B 100 244-7
-
(2003)
Mater. Eng.
, vol.100
, Issue.3
, pp. 244-247
-
-
Wu, Y.J.1
Chen, X.M.2
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