메뉴 건너뛰기




Volumn 52, Issue 9, 2009, Pages 869-877

Structure of silicon/oxide and nitride/oxide interfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; SILICON DEVICES;

EID: 76149089186     PISSN: 10637869     EISSN: None     Source Type: Journal    
DOI: 10.3367/UFNe.0179.200909a.0921     Document Type: Article
Times cited : (19)

References (45)
  • 2
    • 0003588954 scopus 로고
    • Electronic structure and optical properties of silicon nitride
    • ed Rzhanov A V) (Amsterdam: Elsevier
    • Gritsenko V A 1988 "Electronic structure and optical properties of silicon nitride" Silicon Nitride in Electronics (ed Rzhanov A V) (Amsterdam: Elsevier)
    • (1988) Silicon Nitride in Electronics
    • Gritsenko, V.A.1
  • 17
    • 55749101208 scopus 로고    scopus 로고
    • Gritsenko V A 2008 Phys. Usp. 51 699
    • (2008) Phys. Usp. , vol.51 , pp. 699
  • 37
    • 84912440440 scopus 로고
    • 1978 JETP Lett. 27 375
    • (1978) JETP Lett. , vol.27 , pp. 375
  • 43
    • 84950314534 scopus 로고    scopus 로고
    • ONO structures in modern microelectronics: Material science, characterization and application
    • ed Baklanov M, M Greeen, K Maex) (Chichester: John Wiley & Sons
    • Roizin Ya, Gritsenko V 2007 "ONO structures in modern microelectronics: material science, characterization and application" Dielectric Films for Advanced Microelectronics (ed Baklanov M, M Greeen, K Maex) (Chichester: John Wiley & Sons)
    • (2007) Dielectric Films for Advanced Microelectronics , pp. 251
    • Roizin, Y.1    Gritsenko, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.