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Volumn 9, Issue 12, 2009, Pages 5184-5189

Structural characteristics and annealing effect of ZnO epitaxial films grown by atomic layer deposition

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EID: 75249107683     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg900580r     Document Type: Article
Times cited : (23)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.