Threading dislocations in domain-matching epitaxial films of ZnO

Journal of Applied Crystallography

Volumn 40, Issue 5, 2007, Pages 924-930

  Liu, W R ^a   Hsieh, W F ^a   Hsu, C H ^a,b   Liang, Keng S ^a   Chien, F S S ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^c TUNGHAI UNIVERSITY   (Taiwan)

Author keywords

Dislocation; Epitaxial film; X ray diffraction; ZnO

Indexed keywords

EID: 34548550347     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807033997     Document Type: Article

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