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Surface Science

Volumn 443, Issue 1-2, 1999, Pages

In-plane and polar orientations of ZnO thin films grown on atomically flat sapphire

(6) Ohkubo, I a Ohtomo, A a Ohnishi, T a Mastumoto, Y a Koinuma, H a Kawasaki, M a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Diffraction and reflection; Ion scattering spectroscopy; Single crystal epitaxy; X ray scattering; Zinc oxide

Indexed keywords

EID: 0001183311 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)01024-9 Document Type: Article

Times cited : (98)

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16
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.