Origin and consequences of a high stacking fault density in epitaxial ZnO layers

Applied Physics Letters

Volumn 81, Issue 21, 2002, Pages 3972-3974

  Gerthsen, D ^a   Litvinov, D ^a   Gruber, Th ^b   Kirchner, C ^b   Waag, A ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY; IMAGING TECHNIQUES; METALLORGANIC VAPOR PHASE EPITAXY; SPECKLE; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

FRANK PARTIAL DISLOCATIONS;

ZINC OXIDE;

EID: 0037132304     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1523151     Document Type: Article

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