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Volumn 21, Issue 3, 2010, Pages

The effect of the geometry and material properties of a carbon joint produced by electron beam induced deposition on the electrical resistance of a multiwalled carbon nanotube-to-metal contact interface

Author keywords

[No Author keywords available]

Indexed keywords

A-CARBON; CONDUCTIVE FORCE MICROSCOPY; DEPOSITED MATERIALS; DEPOSITION TIME; ELECTRICAL CONTACT RESISTANCE; ELECTRICAL RESISTANCES; ELECTRON BEAM ENERGY; ELECTRON BEAM-INDUCED DEPOSITION; ELECTRONIC DEVICE; JOINT GEOMETRY; LIMITING FACTORS; MATERIAL PROPERTY; MECHANICAL CHARACTERISTICS; METAL CONTACTS; METAL ELECTRODES; MODEL ANALYSIS; MULTI-WALL CARBON NANOTUBES; PROCESS PARAMETERS; RELATIVE IMPORTANCE;

EID: 74949114828     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/3/035202     Document Type: Article
Times cited : (33)

References (50)
  • 1
    • 0033743089 scopus 로고    scopus 로고
    • Single-walled carbon nanotube-polymer composites: Strength and weakness
    • Ajayan P M, Schadler L S, Giannaris C and Rubio A 2000 Single-walled carbon nanotube-polymer composites: strength and weakness Adv. Mater. 12 750
    • (2000) Adv. Mater. , vol.12 , pp. 750
    • Ajayan, P.M.1    Schadler, L.S.2    Giannaris, C.3    Rubio, A.4
  • 2
    • 33644541114 scopus 로고    scopus 로고
    • Physics of carbon nanotube electronic devices
    • Anantram M P and Leonard F 2006 Physics of carbon nanotube electronic devices Rep. Prog. Phys. 69 507-61
    • (2006) Rep. Prog. Phys. , vol.69 , pp. 507-561
    • Anantram, M.P.1    Leonard, F.2
  • 3
    • 3142669846 scopus 로고    scopus 로고
    • Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation
    • Ando A, Shimizu T, Abe H, Nakayama Y and Tokumoto H 2004 Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation Physica E 24 6-9
    • (2004) Physica , vol.24 , pp. 6-9
    • Ando, A.1    Shimizu, T.2    Abe, H.3    Nakayama, Y.4    Tokumoto, H.5
  • 5
    • 0000398823 scopus 로고    scopus 로고
    • The formation of a connection between carbon nanotubes in an electron beam
    • Banhart F 2001 The formation of a connection between carbon nanotubes in an electron beam Nano Lett. 1 329-32
    • (2001) Nano Lett. , vol.1 , pp. 329-332
    • Banhart, F.1
  • 7
    • 14944338761 scopus 로고    scopus 로고
    • Characterization of focused electron beam induced carbon deposits from organic precursors
    • Bret T, Mauron S, Utke I and Hoffmann P 2005 Characterization of focused electron beam induced carbon deposits from organic precursors Microelectron. Eng. 78-9 300-6
    • (2005) Microelectron. Eng. , vol.78 , Issue.9
    • Bret, T.1    Mauron, S.2    Utke, I.3    Hoffmann, P.4
  • 8
    • 0345376737 scopus 로고    scopus 로고
    • In situ control of the focused-electron-beam-induced deposition process
    • Bret T, Utke I, Bachmann A and Hoffmann P 2003 In situ control of the focused-electron-beam-induced deposition process Appl. Phys. Lett. 83 4005-7
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 4005-4007
    • Bret, T.1    Utke, I.2    Bachmann, A.3    Hoffmann, P.4
  • 10
    • 34548806926 scopus 로고    scopus 로고
    • In situ manipulation and electrical characterization of multiwalled carbon nanotubes by using nanomanipulators under scanning electron microscopy
    • Bussolotti F, D'Ortenzi L, Grossi V, Lozzi L, Santucci S and Passacantando M 2007 In situ manipulation and electrical characterization of multiwalled carbon nanotubes by using nanomanipulators under scanning electron microscopy Phys. Rev. B 76 125415
    • (2007) Phys. Rev. , vol.76 , pp. 125415
    • Bussolotti, F.1    D'Ortenzi, L.2    Grossi, V.3    Lozzi, L.4    Santucci, S.5    Passacantando, M.6
  • 11
    • 34547993223 scopus 로고    scopus 로고
    • Effect of electron beam-induced deposition and etching under bias
    • Choi Y R, Rack P D, Frost B and Joy D C 2007 Effect of electron beam-induced deposition and etching under bias Scanning 29 171-6
    • (2007) Scanning , vol.29 , pp. 171-176
    • Choi, Y.R.1    Rack, P.D.2    Frost, B.3    Joy, D.C.4
  • 12
    • 31644448079 scopus 로고    scopus 로고
    • Characterization of amorphous and nanocrystalline carbon films
    • Chu P K and Li L H 2006 Characterization of amorphous and nanocrystalline carbon films Mater. Chem. Phys. 96 253-77
    • (2006) Mater. Chem. Phys. , vol.96 , pp. 253-277
    • Chu, P.K.1    Li, L.H.2
  • 13
    • 40449094185 scopus 로고    scopus 로고
    • A 1 GHz integrated circuit with carbon nanotube interconnects and silicon transistors
    • Close G F, Yasuda S, Paul R, Fujita S and Wong P H S 2008 A 1 GHz integrated circuit with carbon nanotube interconnects and silicon transistors Nano Lett. 8 706-9
    • (2008) Nano Lett. , vol.8 , pp. 706-709
    • Close, G.F.1    Yasuda, S.2    Paul, R.3    Fujita, S.4    Wong, P.H.S.5
  • 14
    • 22944478665 scopus 로고    scopus 로고
    • Mechanics of hydrogenated amorphous carbon deposits from electron-beam-induced deposition of a paraffin precursor
    • Ding W, Dikin D A, Chen X, Piner R D, Ruoff R S, Zussman E, Wang X and Li X 2005 Mechanics of hydrogenated amorphous carbon deposits from electron-beam-induced deposition of a paraffin precursor J. Appl. Phys. 98 014905
    • (2005) J. Appl. Phys. , vol.98 , pp. 014905
    • Ding, W.1    Dikin, D.A.2    Chen, X.3    Piner, R.D.4    Ruoff, R.S.5    Zussman, E.6    Wang, X.7    Li, X.8
  • 16
    • 33847718674 scopus 로고    scopus 로고
    • Effects of local Joule heating on the reduction of contact resistance between carbon nanotubes and metal electrodes
    • Dong L F, Youkey S, Bush J, Jiao J, Dubin V M and Chebiam R V 2007 Effects of local Joule heating on the reduction of contact resistance between carbon nanotubes and metal electrodes J. Appl. Phys. 101 024320
    • (2007) J. Appl. Phys. , vol.101 , pp. 024320
    • Dong, L.F.1    Youkey, S.2    Bush, J.3    Jiao, J.4    Dubin, V.M.5    Chebiam, R.V.6
  • 17
    • 0242603790 scopus 로고    scopus 로고
    • Interpretation of Raman spectra of disordered and amorphous carbon
    • Ferrari A C and Robertson J 2000 Interpretation of Raman spectra of disordered and amorphous carbon Phys. Rev. B 61 14095-107
    • (2000) Phys. Rev. , vol.61 , pp. 14095-14107
    • Ferrari, A.C.1    Robertson, J.2
  • 19
    • 65449138344 scopus 로고    scopus 로고
    • Structural evolution and graphitization of metallorganic-Pt suspended nanowires under high-current-density electrical test
    • Gazzadi G C and Frabboni S 2009 Structural evolution and graphitization of metallorganic-Pt suspended nanowires under high-current-density electrical test Appl. Phys. Lett. 94 3
    • (2009) Appl. Phys. Lett. , vol.94 , pp. 173112
    • Gazzadi, G.C.1    Frabboni, S.2
  • 20
    • 20144387793 scopus 로고    scopus 로고
    • How do carbon nanotubes fit into the semiconductor roadmap?
    • Graham A P et al 2005 How do carbon nanotubes fit into the semiconductor roadmap? Appl. Phys. A 80 1141-51
    • (2005) Appl. Phys. , vol.80 , pp. 1141-1151
    • Graham, A.P.1
  • 21
    • 24644454319 scopus 로고    scopus 로고
    • Strain-sensitive Raman modes of carbon nanotubes in deflecting freely suspended nanomembranes
    • Jiang C Y, Ko H Y and Tsukruk V V 2005 Strain-sensitive Raman modes of carbon nanotubes in deflecting freely suspended nanomembranes Adv. Mater. 17 2127
    • (2005) Adv. Mater. , vol.17 , pp. 2127
    • Jiang, C.Y.1    Ko, H.Y.2    Tsukruk, V.V.3
  • 22
    • 0035878503 scopus 로고    scopus 로고
    • Universal expression for localization length in metallic carbon nanotubes
    • Jiang J, Dong J M, Yang H T and Xing D Y 2001 Universal expression for localization length in metallic carbon nanotubes Phys. Rev. B 6404 4
    • (2001) Phys. Rev. , vol.6404 , pp. 4
    • Jiang, J.1    Dong, J.M.2    Yang, H.T.3    Xing, D.Y.4
  • 23
    • 42949138794 scopus 로고    scopus 로고
    • The role of an amorphous carbon layer on a multi-wall carbon nanotube attached atomic force microscope tip in making good electrical contact to a gold electrode
    • Kahng Y H, Choi J, Park B C, Kim D H, Choi J H, Lyou J and Ahn S J 2008 The role of an amorphous carbon layer on a multi-wall carbon nanotube attached atomic force microscope tip in making good electrical contact to a gold electrode Nanotechnology 19 7
    • (2008) Nanotechnology , vol.19 , pp. 7
    • Kahng, Y.H.1    Choi, J.2    Park, B.C.3    Kim, D.H.4    Choi, J.H.5    Lyou, J.6    Ahn, S.J.7
  • 24
    • 0000296338 scopus 로고
    • Spreading resistance in cylindrical semiconductor devices
    • Kennedy D P 1960 Spreading resistance in cylindrical semiconductor devices J. Appl. Phys. 31 1490-7
    • (1960) J. Appl. Phys. , vol.31 , pp. 1490-1497
    • Kennedy, D.P.1
  • 27
    • 44949265454 scopus 로고    scopus 로고
    • Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects
    • Li H, Yin W Y, Banerjee K and Mao J F 2008 Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects IEEE Trans. Electron Devices 55 1328-37
    • (2008) IEEE Trans. Electron Devices , vol.55 , pp. 1328-1337
    • Li, H.1    Yin, W.Y.2    Banerjee, K.3    Mao, J.F.4
  • 28
    • 27144461665 scopus 로고    scopus 로고
    • Multichannel ballistic transport in multiwall carbon nanotubes
    • Li H J, Lu W G, Li J J, Bai X D and Gu C Z 2005 Multichannel ballistic transport in multiwall carbon nanotubes Phys. Rev. Lett. 95 086601
    • (2005) Phys. Rev. Lett. , vol.95 , pp. 086601
    • Li, H.J.1    Lu, W.G.2    Li, J.J.3    Bai, X.D.4    Gu, C.Z.5
  • 30
    • 0031547256 scopus 로고    scopus 로고
    • Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopy
    • Miura N, Ishii H, Shirakashi J, Yamada A and Konagai M 1997 Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopy Appl. Surf. Sci. 114 269-73
    • (1997) Appl. Surf. Sci. , vol.113-114 , pp. 269-273
    • Miura, N.1    Ishii, H.2    Shirakashi, J.3    Yamada, A.4    Konagai, M.5
  • 31
    • 4344706353 scopus 로고    scopus 로고
    • Constructing, connecting and soldering nanostructures by environmental electron beam deposition
    • Molhave K, Madsen D N, Dohn S and Boggild P 2004 Constructing, connecting and soldering nanostructures by environmental electron beam deposition Nanotechnology 15 1047-53
    • (2004) Nanotechnology , vol.15 , pp. 1047-1053
    • Molhave, K.1    Madsen, D.N.2    Dohn, S.3    Boggild, P.4
  • 33
    • 13444256520 scopus 로고    scopus 로고
    • Performance comparison between carbon nanotube and copper interconnects for gigascale integration (GSI)
    • DOI 10.1109/LED.2004.841440
    • Naeemi A, Sarvari R and Meindl J D 2005 Performance comparison between carbon nanotube and copper interconnects for gigascale integration (GSI) IEEE Electron Device Lett. 26 84-6 (Pubitemid 40205844)
    • (2005) IEEE Electron Device Letters , vol.26 , Issue.2 , pp. 84-86
    • Naeemi, A.1    Sarvari, R.2    Meindl, J.D.3
  • 35
    • 65549115104 scopus 로고    scopus 로고
    • The transient electrical conductivity of W-based electron-beam-induced deposits during growth, irradiation and exposure to air
    • Porrati F, Sachser R and Huth M 2009 The transient electrical conductivity of W-based electron-beam-induced deposits during growth, irradiation and exposure to air Nanotechnology 20 10
    • (2009) Nanotechnology , vol.20 , pp. 10
    • Porrati, F.1    Sachser, R.2    Huth, M.3
  • 36
    • 15444347981 scopus 로고    scopus 로고
    • Diameter-selective Raman scattering from vibrational modes in carbon nanotubes
    • Rao A M et al 1997 Diameter-selective Raman scattering from vibrational modes in carbon nanotubes Science 275 187-91
    • (1997) Science , vol.275 , pp. 187-191
    • Rao, A.M.1
  • 37
    • 0000978830 scopus 로고    scopus 로고
    • Kinetics of the conversion of broken diamond (sp(3)) bonds to graphitic (sp(2)) bonds
    • Reznik A, Richter V and Kalish R 1997 Kinetics of the conversion of broken diamond (sp(3)) bonds to graphitic (sp(2)) bonds Phys. Rev. B 56 7930-4
    • (1997) Phys. Rev. , vol.56 , pp. 7930-7934
    • Reznik, A.1    Richter, V.2    Kalish, R.3
  • 38
    • 34248182889 scopus 로고    scopus 로고
    • Broadband electrical characterization of multiwalled carbon nanotubes and contacts
    • Rice P, Wallis T M, Russek S E and Kabos P 2007 Broadband electrical characterization of multiwalled carbon nanotubes and contacts Nano Lett. 7 1086-90
    • (2007) Nano Lett. , vol.7 , pp. 1086-1090
    • Rice, P.1    Wallis, T.M.2    Russek, S.E.3    Kabos, P.4
  • 42
    • 36749003969 scopus 로고    scopus 로고
    • Characterization and air pressure sensing of doubly clamped multi-walled carbon nanotubes
    • Song J W, Lee J H, Seo H W and Han C S 2008 Characterization and air pressure sensing of doubly clamped multi-walled carbon nanotubes Nanotechnology 19 4
    • (2008) Nanotechnology , vol.19 , pp. 4
    • Song, J.W.1    Lee, J.H.2    Seo, H.W.3    Han, C.S.4
  • 44
    • 0028513408 scopus 로고
    • Raman fingerprinting of amorphous-carbon films
    • Tamor M A and Vassell W C 1994 Raman fingerprinting of amorphous-carbon films J. Appl. Phys. 76 3823-30
    • (1994) J. Appl. Phys. , vol.76 , pp. 3823-3830
    • Tamor, M.A.1    Vassell, W.C.2
  • 45
    • 0019552835 scopus 로고
    • Electron-beam-induced conductivity and related processes in insulating films
    • Taylor D M 1981 Electron-beam-induced conductivity and related processes in insulating films IEE Proc. A 128 174-82
    • (1981) IEE Proc. , vol.128 , pp. 174-182
    • Taylor, D.M.1
  • 46
    • 0032614777 scopus 로고    scopus 로고
    • Contact resistance of carbon nanotubes
    • Tersoff J 1999 Contact resistance of carbon nanotubes Appl. Phys. Lett. 74 2122-4
    • (1999) Appl. Phys. Lett. , vol.74 , pp. 2122-2124
    • Tersoff, J.1
  • 48
    • 48249103968 scopus 로고    scopus 로고
    • Controlling electron-beam-induced carbon deposition on carbon nanotubes by Joule heating
    • Wei X L, Liu Y, Chen Q and Peng L M 2008 Controlling electron-beam- induced carbon deposition on carbon nanotubes by Joule heating Nanotechnology 19 5
    • (2008) Nanotechnology , vol.19 , pp. 5
    • Wei, X.L.1    Liu, Y.2    Chen, Q.3    Peng, L.M.4
  • 49
    • 0034229826 scopus 로고    scopus 로고
    • Electronic structure of deformed carbon nanotubes
    • Yang L and Han J 2000 Electronic structure of deformed carbon nanotubes Phys. Rev. Lett. 85 154-7
    • (2000) Phys. Rev. Lett. , vol.85 , pp. 154-157
    • Yang, L.1    Han, J.2
  • 50
    • 34547902859 scopus 로고    scopus 로고
    • Barrier modification at contacts between carbon nanotube and Pt electrode using well-controlled Joule heating
    • Yoshikawa Y, Akita S and Nakayama Y 2007 Barrier modification at contacts between carbon nanotube and Pt electrode using well-controlled Joule heating Japan. J. Appl. Phys. 2 46 L359-61
    • (2007) Japan. J. Appl. Phys. , vol.46
    • Yoshikawa, Y.1    Akita, S.2    Nakayama, Y.3


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