High-resolution Raman microscopy of curled carbon nanotubes

Applied Physics Letters

Volumn 85, Issue 13, 2004, Pages 2598-2600

  Ko, Hyunhyub ^a   Pikus, Yuri ^a   Jiang, Chaoyang ^a   Jauss, Andrea ^b   Hollricher, Olaf ^b   Tsukruk, Vladimir V ^a  

^a Iowa State University   (United States)

^b WITec Wissenschaftliche Instrumente und Technologie GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CHEMICAL SENSORS; COMPRESSIVE STRESS; DEFORMATION; LIGHT ABSORPTION; MICROSENSORS; NEODYMIUM LASERS; RAMAN SPECTROSCOPY; STRAIN; TENSILE STRESS;

COMPRESSIVE STRAIN; CONFOCAL RAMAN IMAGING SPECTROSCOPY; FREQUENCY SHIFTS; RAMAN MAPPING;

CARBON NANOTUBES;

EID: 7544250376     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1795981     Document Type: Article

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