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Volumn 24, Issue 1-2 SPEC. ISS., 2004, Pages 6-9
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Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation
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Author keywords
Carbon nanotube; Carbon nanotube SPM probe; Electrical contact; Electron beam irradiation
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Indexed keywords
ELECTRIC CONTACTS;
ELECTRIC POTENTIAL;
ELECTRON BEAMS;
ELECTRON IRRADIATION;
PROBES;
SCANNING ELECTRON MICROSCOPY;
CARBON NANOTUBE SPM PROBE;
ELECTRON BEAM IRRADIATION;
SCANNING PROBE MICROSCOPY;
CARBON NANOTUBES;
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EID: 3142669846
PISSN: 13869477
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physe.2004.04.014 Document Type: Conference Paper |
Times cited : (15)
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References (7)
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