Improvement of electrical contact at carbon nanotube/Pt by selective electron irradiation

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 24, Issue 1-2 SPEC. ISS., 2004, Pages 6-9

  Ando, Atsushi ^a   Shimizu, Tetsuo ^a   Abe, Hidekazu ^a   Nakayama, Yoshikazu ^b   Tokumoto, Hiroshi ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Osaka City University   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Carbon nanotube; Carbon nanotube SPM probe; Electrical contact; Electron beam irradiation

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON IRRADIATION; PROBES; SCANNING ELECTRON MICROSCOPY;

CARBON NANOTUBE SPM PROBE; ELECTRON BEAM IRRADIATION; SCANNING PROBE MICROSCOPY;

CARBON NANOTUBES;

EID: 3142669846     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2004.04.014     Document Type: Conference Paper

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