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Volumn 20, Issue 19, 2009, Pages
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The transient electrical conductivity of W-based electron-beam-induced deposits during growth, irradiation and exposure to air
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGRADATION BEHAVIORS;
ELECTRICAL CONDUCTIVITIES;
ELECTRICAL CONDUCTIVITY MEASUREMENTS;
ELECTRICAL TRANSPORTS;
ELECTRON BEAM-INDUCED DEPOSITIONS;
ELECTRON-BEAM;
ELECTRON-BEAM PARAMETERS;
GROWTH PROCESS;
IN-SITU;
MATRIXES;
METAL GRAINS;
POST IRRADIATIONS;
TEMPERATURE-DEPENDENT CONDUCTIVITIES;
TRAP SITES;
TUNGSTEN HEXACARBONYL;
ALGEBRA;
ELECTRIC CONDUCTIVITY;
ELECTRIC CONDUCTIVITY MEASUREMENT;
ELECTRON BEAMS;
IRRADIATION;
TUNGSTEN;
ELECTRONS;
TUNGSTEN;
HEXACARBONYLTUNGSTEN;
NANOMATERIAL;
ARTICLE;
DEGRADATION;
ELECTRIC CONDUCTIVITY;
ELECTRON BEAM;
ELECTRON MICROSCOPE;
IRRADIATION;
PARTICLE SIZE;
PRIORITY JOURNAL;
TEMPERATURE DEPENDENCE;
TRANSMISSION ELECTRON MICROSCOPY;
AIR;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
ELECTROMAGNETIC FIELD;
ELECTRON;
ENVIRONMENTAL EXPOSURE;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
RADIATION EXPOSURE;
SURFACE PROPERTY;
AIR;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
ELECTROMAGNETIC FIELDS;
ELECTRONS;
ENVIRONMENTAL EXPOSURE;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
SURFACE PROPERTIES;
TUNGSTEN;
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EID: 65549115104
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/19/195301 Document Type: Article |
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Times cited : (57)
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References (30)
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