Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects

IEEE Transactions on Electron Devices

Volumn 55, Issue 6, 2008, Pages 1328-1337

  Li, Hong ^a,b   Yin, Wen Yan ^a   Banerjee, Kaustav ^b   Mao, Jun Fa ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b University of California   (United States)

Author keywords

Carbon nanotube (CNT); Circuit model; Interconnect; Multi walled CNT (MWCNT); Performance analysis; Signal delay; Single walled CNT (SWCNT)

Indexed keywords

COMPUTER SIMULATION; COPPER; INTEGRATED CIRCUIT LAYOUT; INTERCONNECTION NETWORKS; VLSI CIRCUITS;

CIRCUIT MODEL; PERFORMANCE ANALYSIS;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 44949265454     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.922855     Document Type: Article

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