Measurement of twofold astigmatism of probe-forming lens using low-order zone-axis ronchigram

Ultramicroscopy

Volumn 108, Issue 4, 2008, Pages 339-345

  Kuramochi, Koji ^a   Yamazaki, Takashi ^a   Kotaka, Yasutoshi ^b   Kikuchi, Yoshio ^b   Hashimoto, Iwao ^a   Watanabe, Kazuto ^c  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

Astigmatism; Lens aberration function; Ronchigram; STEM

Indexed keywords

CRYSTALLINE MATERIALS; MEASUREMENT THEORY; PROBES;

LOW-ORDER ZONE-AXIS RONCHIGRAM; PROBE-FORMING LENS; TWOFOLD ASTIGMATISM;

LENSES;

STRONTIUM; TITANIUM DIOXIDE;

ARTICLE; CRYSTAL; ELECTRON DIFFRACTION; LENS; OPTICAL RESOLUTION; OPTICS; RONCHIGRAM; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 38949138733     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.05.007     Document Type: Article

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