|
Volumn 11, Issue 1, 2010, Pages 127-136
|
Understanding the effect of semiconductor thickness on device characteristics in organic thin film transistors by way of two-dimensional simulations
|
Author keywords
Device simulation; Energy band offset; Low mobility layer; Morphology; Organic thin film transistor; Pentacene; Semiconductor thickness; Semiconductor insulator interface
|
Indexed keywords
CHEMICAL SENSORS;
FIELD EFFECT TRANSISTORS;
FILM THICKNESS;
INTERFACES (MATERIALS);
MORPHOLOGY;
PHOTOTRANSISTORS;
SEMICONDUCTING ORGANIC COMPOUNDS;
THIN FILM TRANSISTORS;
THIN FILMS;
DEVICE SIMULATIONS;
LOW MOBILITY;
ORGANIC THIN FILM TRANSISTORS;
PENTACENES;
SEMICONDUCTOR THICKNESS;
SEMICONDUCTOR-INSULATOR INTERFACE;
THIN FILM CIRCUITS;
|
EID: 72649091636
PISSN: 15661199
EISSN: None
Source Type: Journal
DOI: 10.1016/j.orgel.2009.10.009 Document Type: Article |
Times cited : (49)
|
References (39)
|