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Volumn 11, Issue 1, 2010, Pages 127-136

Understanding the effect of semiconductor thickness on device characteristics in organic thin film transistors by way of two-dimensional simulations

Author keywords

Device simulation; Energy band offset; Low mobility layer; Morphology; Organic thin film transistor; Pentacene; Semiconductor thickness; Semiconductor insulator interface

Indexed keywords

CHEMICAL SENSORS; FIELD EFFECT TRANSISTORS; FILM THICKNESS; INTERFACES (MATERIALS); MORPHOLOGY; PHOTOTRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS; THIN FILMS;

EID: 72649091636     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2009.10.009     Document Type: Article
Times cited : (49)

References (39)
  • 16
    • 72649103529 scopus 로고    scopus 로고
    • S.M. Sze, Physics of Semiconductor Devices, second ed, John Wiley and Sons
    • S.M. Sze, Physics of Semiconductor Devices, second ed., John Wiley and Sons.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.