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Volumn 85, Issue 17, 2004, Pages 3899-3901

Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARRIER MOBILITY; DATA ACQUISITION; ELECTRIC INSULATORS; GRAPHITE; OPTICAL IMAGE STORAGE; SINGLE CRYSTALS;

EID: 9744261680     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1812368     Document Type: Article
Times cited : (285)

References (15)
  • 8
    • 9744276268 scopus 로고    scopus 로고
    • V. Podzorov, E. Menard, A. Borissov, V. Kiryukhin, J. A. Rogers, and M. E. Gershenson, cond-mat/, 0403575 (2004)
    • V. Podzorov, E. Menard, A. Borissov, V. Kiryukhin, J. A. Rogers, and M. E. Gershenson, cond-mat/, 0403575 (2004).
  • 9
    • 9744259091 scopus 로고    scopus 로고
    • M. E. Gershenson (private communication)
    • M. E. Gershenson (private communication).
  • 15
    • 9744248975 scopus 로고    scopus 로고
    • R. W. I. de Boer (unpublished)
    • R. W. I. de Boer (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.