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Volumn 17, Issue 14, 2005, Pages 1795-1798

Thickness dependence of mobility in pentacene thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DIELECTRIC MATERIALS; MORPHOLOGY; SINGLE CRYSTALS; SUBLIMATION; SUBSTRATES; THIN FILMS;

EID: 22944466650     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200402077     Document Type: Article
Times cited : (307)

References (33)
  • 23
    • 22944465212 scopus 로고    scopus 로고
    • note
    • Keep in mind that measurements of coverage are limited by the AFM lateral resolution (i.e., the AFM cannot resolve the individual arrangement of the molecules in the grain boundaries, nor it can resolve the number of vacancies in such boundaries).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.