Morphology identification of the thin film phases of vacuum evaporated pentacene on SIO2 substrates

Synthetic Metals

Volumn 104, Issue 3, 1999, Pages 175-178

  Bouchoms, I P M ^a   Schoonveld, W A ^a   Vrijmoeth, J ^a   Klapwijk, T M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; EVAPORATION; MECHANICAL PROPERTIES; MORPHOLOGY; OLEFINS; POLYCRYSTALLINE MATERIALS; SILICA; SUBLIMATION; SUBSTRATES; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC PHASES; FILM THICKNESS; LAMELLAR STRUCTURES; PENTACENE;

THIN FILMS;

EID: 0032641623     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00050-8     Document Type: Article

References (8)

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8. Vrijmoeth J., Stok R.W., Veldman R., Schoonveld W.A., Klapwijk T.M. J. Appl. Phys. 83(7):1998;3816.