Polarization effects in the channel of an organic field-effect transistor

Journal of Applied Physics

Volumn 100, Issue 2, 2006, Pages

  Houili, H ^a   Picon, J D ^a   Zuppiroli, L ^a   Bussac, M N ^b  

^a EPFL   (Switzerland)

^b CENTRE DE PHYSIQUE THÉORIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CHARGE CARRIERS; COUPLED CIRCUITS; DIELECTRIC MATERIALS; ELECTRIC INSULATORS; POLARIZATION;

HIGH-PERMITTIVITY DIELECTRIC; ORGANIC FIELD-EFFECT TRANSISTOR (OFET); POLYMER GATE INSULATOR;

FIELD EFFECT TRANSISTORS;

EID: 33746801907     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2214363     Document Type: Article

References (29)

1. V. Podzorov, E. Menard, A. Borissov, V. Kiryukhin, J. A. Rogers, and M. E. Gershenson, Phys. Rev. Lett. 93, 086602 (2004).
2. F. Dinelli, M. Murgia, P. Levy, M. Cavalleni, F. Biscarini, and D. M. de Leeuw, Phys. Rev. Lett. 92, 116802 (2004).
3. J. H. Kang, D. A. da Silva Filho, J. L. Bredas, and X.-Y. Zhu, Appl. Phys. Lett. 86, 152115 (2005).
4. M. Daraktchiev, A. von Mühlenen, F. Nüesch, M. Schaer, M. Brinkmann, M. N. Bussac, and L. Zuppiroli, New J. Phys. 7, 133 (2005).
5. J. Veres, S. D. Ogier, S. W. Leeming, D. C. Cupertino, and S. M. Khaffaf, Adv. Funct. Mater. 13, 199 (2003).
6. A. F. Stassen, R. W. I. de Boer, N. N. Iosad, and A. F. Morpurgo, Appl. Phys. Lett. 85, 3899 (2004).
7. T. Holstein, Ann. Phys. (N.Y.) 8, 343 (1959).
8. Y. C. Cheng, R. J. Silbey, D. A. da Silva Filho, J. P. Calbert, J. Cornil, and J. L. Bredas, J. Chem. Phys. 118, 3764 (2003).
9. E. A. Silinsh and V. Čápek, Organic Molecular Crystals (AIP, New York, 1994).
10. J. Appel, Solid State Phys. 25, 193 (1968).
11. A. S. Davydov, Théorie, du Solide (Mir, Moscow, 1980).
12. M. N. Bussac, J. D. Picon, and L. Zuppiroli, Europhys. Lett. 66, 392 (2004).
13. N. Kirova and M. N. Bussac, Phys. Rev. B 68, 235312 (2003).
14. J. C. Sancho-García, G. Horowitz, J. L. Brédas, and J. Cornil, J. Chem. Phys. 119, 12563 (2003).
15. M. Schubert, T. E. Tiwald, and C. M. Herzinger, Phys. Rev. B 61, 8187 (2000).
16. K. Hannewald and P. A. Bobbert, Phys. Rev. B 69, 075212 (2004);
17. K. Hannewald, V. M. Stojanović, J. M. Schellekens, P. A. Bobbert, G. Kresse, and J. Hafner, Phys. Rev. B ibid. 69, 075211 (2004).
18. P. J. Bounds and R. W. Munn, Chem. Phys. 44, 103 (1979).
19. E. V. Tsiper and Z. G. Soos, Phys. Rev. B 68, 085301 (2003).
20. J. D. Jackson, Classical Electrodynamics (Wiley, New York, 1999), p. 154.
21. J. L. Bredas, J. P. Calbert, D. A. da Silva Filho, and J. Cornil, Proc. Natl. Acad. Sci. U.S.A. 99, 5804 (2002).
22. V. Coropceanu, M. Malagoli, D. A. da Silva Filho, N. E. Gruhn, T. G. Bill, and J. L. Bredas, Phys. Rev. Lett. 89, 275503 (2002).
23. J. Sak, Phys. Rev. B 6, 3981 (1972).
24. T. D. Lee, F. E. Low, and D. Pines, Phys. Rev. 90, 297 (1953).
25. R. B. Campbell, J. M. Robertson, and J. Trotter, Acta Crystallogr. 14, 705 (1961).
26. J. Humliček and A. Röseler, Thin Solid Films 234, 332 (1993).
27. M. Schubert, T. E. Tiwald, and C. M. Herzinger, Phys. Rev. B 61, 8187 (2000).
28. E. Franke, C. L. Trimble, J. M. DeVries, M. Schubert, and F. Frost, J. Appl. Phys. 88, 5166 (2000).
29. R. Sikora, J. Phys. Chem. Solids 66, 1069 (2005).