Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Simon, G H ^a   Konig T ^a   Rust, H P ^a   Heyde, M ^a   Freund, H J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA FILMS; ANTIPHASE DOMAIN BOUNDARY; ATOMIC STRUCTURE; DOMAIN BOUNDARY; DYNAMIC FORCE MICROSCOPY; FILM SURFACES; GROWTH BEHAVIOUR; LATERAL DISPLACEMENTS; LOCAL STRUCTURE; SURFACE SENSITIVITY; SURFACE UNITS; TRANSLATIONAL SYMMETRY; ULTRA-THIN; UNIT CELLS;

ALUMINA; FILM GROWTH; FREQUENCY MODULATION; OXYGEN; TOPOGRAPHY; ULTRATHIN FILMS;

SURFACE TOPOGRAPHY;

EID: 70450140197     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/9/093009     Document Type: Article

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