Growth of thin alumina films on a vicinal NiAl surface

Surface Science

Volumn 601, Issue 19, 2007, Pages 4603-4607

  Ulrich, Stefan ^a   Nilius, Niklas ^a   Freund, Hans Joachim ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

Aluminum oxide; Metal insulator interface; Oxidation; Scanning tunneling microscopy; Surface stress

Indexed keywords

ALUMINA; FILM GROWTH; OXIDATION; SCANNING TUNNELING MICROSCOPY; SURFACE MORPHOLOGY; SURFACE TENSION;

ALUMINUM OXIDE; SURFACE STRESS; THIN ALUMINA FILMS; TRIANGULAR PLANES;

THIN FILMS;

EID: 34548831640     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.07.020     Document Type: Article

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