Non-contact AFM observation of the (sqrt(3) × sqrt(3)) to (3 × 3) phase transition on Sn/Ge(1 1 1) and Sn/Si(1 1 1) surfaces

Applied Surface Science

Volumn 253, Issue 6, 2007, Pages 3072-3076

  Yi, Insook ^a,b   Nishi, Ryuji ^a   Sugimoto, Yoshiaki ^a   Morita, Seizo ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b Handai Frontier Research Center   (Japan)

Author keywords

(3 3) Phase; (sqrt(3) sqrt(3)) Phase; Low temperature; Non contact atomic force microscope (NC AFM); Phase transition; Sn Ge(1 1 1); Sn Si(1 1 1)

Indexed keywords

ATOMIC FORCE MICROSCOPY; GERMANIUM; PHASE TRANSITIONS; THERMAL EFFECTS; TIN;

NON-CONTACT ATOMIC FORCE MICROSCOPE (NC-AFM);

CRYSTAL STRUCTURE;

EID: 33845804331     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.06.061     Document Type: Article

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