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Volumn 359, Issue 1-2, 2002, Pages 41-47

Structure investigation of the topmost layer of a thin ordered alumina film grown on NiA1(1 1 0) by low temperature scanning tunneling microscopy

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Indexed keywords


EID: 0037071649     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(02)00578-X     Document Type: Article
Times cited : (52)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.