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Volumn 65, Issue 20, 2002, Pages 2014011-2014013
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Noncontact atomic force microscopy imaging of ultrathin Al2O3 on NiAl(110)
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM OXIDE;
NICKEL;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
ELECTRON DIFFRACTION;
FILM;
SCANNING TUNNELING MICROSCOPY;
SPECTROSCOPY;
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EID: 0037095393
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (17)
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References (20)
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