Insulators at the ultrathin limit: Electronic structure studied by scanning tunnelling microscopy and scanning tunnelling spectroscopy

Journal of Physics Condensed Matter

Volumn 16, Issue 4, 2004, Pages

  Schintke, Silvia ^a   Schneider, Wolf Dieter ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b Inst de Theor des Phenomenes Phys   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON TUNNELING; ELECTRONIC STRUCTURE; MAGNESIA; MONOLAYERS; PROBABILITY DENSITY FUNCTION; RESONANCE; SCANNING TUNNELING MICROSCOPY; SILVER; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; ULTRATHIN FILMS;

LOCAL DENSITY OF STATES (LDOS); SCANNING TUNNELING SPECTROSCOPY (STS);

ELECTRIC INSULATORS;

EID: 1042298593     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/4/R02     Document Type: Review

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