Ultrathin alumina film on Cu-9at%Al(1 1 1)

Surface Science

Volumn 602, Issue 10, 2008, Pages 1750-1756

  Napetschnig, E ^a   Schmid, M ^a   Varga, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Aluminium; Aluminium oxide; Auger electron spectroscopy (AES); Copper; Low energy ion scattering (LEIS); Metal oxide interfaces; Palladium; Scanning tunneling microscopy (STM)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER ALLOYS; CRYSTALS; LOW ENERGY ELECTRON DIFFRACTION; OXIDATION; SCANNING TUNNELING MICROSCOPY;

ALUMINIUM OXIDE; LOW ENERGY ION SCATTERING (LEIS); METAL-OXIDE INTERFACES;

ULTRATHIN FILMS;

EID: 43849092840     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.02.040     Document Type: Article

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