Oxygen-deficient line defects in an ultrathin aluminum oxide film

Physical Review Letters

Volumn 97, Issue 4, 2006, Pages

  Schmid, M ^a   Shishkin, M ^b   Kresse, G ^b   Napetschnig, E ^a   Varga, P ^a   Kulawik, M ^c   Nilius, N ^c   Rust, H P ^c   Freund, H J ^c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; BONDING; CRYSTAL DEFECTS; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY;

ALUMINUM OXIDE FILM; ANTIPHASE DOMAIN BOUNDARY; DENSITY-FUNCTIONAL THEORY; LOCAL BONDING;

ULTRATHIN FILMS;

EID: 33746361822     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.046101     Document Type: Article

References (23)

1. E. Wahlström, Phys. Rev. Lett. 90, 026101 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.026101
2. M. Bäumer and H.-J. Freund, Prog. Surf. Sci. 61, 127 (1999). PSSFBP 0079-6816 10.1016/S0079-6816(99)00012-X
3. M. Kulawik, N. Nilius, H.-P. Rust, and H.-J. Freund, Phys. Rev. Lett. 91, 256101 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.91.256101
4. N. Nilius, M. Kulawik, H.-P. Rust, and H.-J. Freund, Phys. Rev. B PRBMDO 0163-1829 69, 121401(R) (2004). 10.1103/PhysRevB.69.121401
5. R.M. Jaeger, Surf. Sci. 259, 235 (1991). SUSCAS 0039-6028 10.1016/0039-6028(91)90555-7
6. J. Libuda, Surf. Sci. 318, 61 (1994). SUSCAS 0039-6028 10.1016/0039-6028(94)90341-7
7. A. Stierle, Science 303, 1652 (2004). SCIEAS 0036-8075 10.1126/science.1094060
8. N. Nilius, T.M. Wallis, and W. Ho, Phys. Rev. Lett. 90, 046808 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.046808
9. G. Kresse, Science 308, 1440 (2005). SCIEAS 0036-8075 10.1126/science.1107783
10. H.-P. Rust, J. Buisset, E.K. Schweizer, and L. Cramer, Rev. Sci. Instrum. 68, 129 (1997). RSINAK 0034-6748 10.1063/1.1147846
11. A. Stierle, F. Renner, R. Streitel, and H. Dosch, Phys. Rev. B PRBMDO 0163-1829 64, 165413 (2001). 10.1103/PhysRevB.64.165413
12. G. Kresse and J. Furthmüller, Comput. Mater. Sci. 6, 15 (1996). CMMSEM 0927-0256 10.1016/0927-0256(96)00008-0
13. J.P. Perdew, Phys. Rev. B PRBMDO 0163-1829 46, 6671 (1992). 10.1103/PhysRevB.46.6671
14. J. Heyd, G.E. Scuseria, and M. Ernzerhof, J. Chem. Phys. 118, 8207 (2003). JCPSA6 0021-9606 10.1063/1.1564060
15. J. Paier, R. Hirsch, M. Marsman, and G. Kresse, J. Chem. Phys. 122, 234102 (2005). JCPSA6 0021-9606 10.1063/1.1926272
16. P.E. Blöchl, Phys. Rev. B PRBMDO 0163-1829 50, 17953 (1994). 10.1103/PhysRevB.50.17953
17. G. Kresse and D. Joubert, Phys. Rev. B PRBMDO 0163-1829 59, 1758 (1999). 10.1103/PhysRevB.59.1758
18. J. Tersoff and D.R. Hamann, Phys. Rev. B PRBMDO 0163-1829 31, 805 (1985). 10.1103/PhysRevB.31.805
19. M. Hagen and M.W. Finnis, Philos. Mag. A PMAADG 0141-8610 77, 447 (1998). 10.1080/014186198254533
20. S. Andersson, Surf. Sci. 442, L964 (1999). SUSCAS 0039-6028 10.1016/S0039-6028(99)00915-2
21. A. Janotti and C.G. Van de Walle, Appl. Phys. Lett. 87, 122102 (2005). APPLAB 0003-6951 10.1063/1.2053360
22. A. Kerber, IEEE Electron Device Lett. EDLEDZ 0741-3106 24, 87 (2003). 10.1109/LED.2003.808844
23. B. Hammer, Top. Catal. TOCAFI 1022-5528 37, 3 (2006). 10.1007/s11244-006-0004-y