Translation-related domain boundaries form to relieve strain in a thin alumina film on NiAl (110)

Applied Physics Letters

Volumn 88, Issue 14, 2006, Pages

  McCarty, Kevin F ^a   Pierce, John P ^a   Carter, C Barry ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NIAL; PLANAR DEFECTS; THIN ALUMINA FILM; TRANSLATION-RELATED DOMAIN BOUNDARIES;

ALUMINA; CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRON MICROSCOPY; FILM GROWTH; NICKEL ALLOYS; STRAIN;

THIN FILMS;

EID: 33646694805     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2191739     Document Type: Article

References (24)

1. G. P. Dimitrakopulos, P. Komninou, and R. C. Pond, Phys. Status Solidi B 227, 45 (2001).
2. M. J. Stowell, in Epitaxial Growth, Part B, edited by, J. W. Matthews, (Academic, New York, 1975), p. 437.
3. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum, New York, 1996), p. 381.
4. J. P. Hirth and J. Lothe, Theory of Dislocations (Wiley, New York, 1982), pp. 306 and 384.
5. J. Libuda, F. Winkelmann, M. Baumer, H. J. Freund, T. Bertrams, H. Neddermeyer, and K. Muller, Surf. Sci. 318, 61 (1994).
6. M. Kulawik, N. Nilius, H. P. Rust, and H. J. Freund, Phys. Rev. Lett. 91, 256101 (2003).
7. A. Stierle, F. Renner, R. Streitel, H. Dosch, W. Drube, and B. C. Cowie, Science 303, 1652 (2004).
8. R. M. Jaeger, H. Kuhlenbeck, H. J. Freund, M. Wuttig, W. Hoffmann, R. Franchy, and H. Ibach, Surf. Sci. 259, 235 (1991).
9. G. Kresse, M. Schmid, E. Napetschnig, M. Shishkin, L. Kohler, and P. Varga, Science 308, 1440 (2005).
10. K. F. McCarty, Surf. Sci. 474, L165 (2001).
11. J. P. Pierce (unpublished).
12. H. Kroemer, K. J. Polasko, and S. C. Wright, Appl. Phys. Lett. 36, 763 (1980).
13. J. C. Phillips, J. Vac. Sci. Technol. 19, 545 (1981).
14. S. L. Hsia, T. Y. Tan, P. Smith, and G. E. McGuire, J. Appl. Phys. 15, 7579 (1991).
15. N. H. Cho and C. B. Carter, J. Mater. Sci. 36, 4209 (2001).
16. O. I. Lebedev, G. Van Tendeloo, A. M. Abakumov, S. Amelinckx, B. Leibold, and H. U. Habermeier, Philos. Mag. A 79, 1461 (1999).
17. S. Celotto, W. Eerenstein, and T. Hibma, Eur. Phys. J. B 36, 271 (2003).
18. H. Li, H. Zheng, L. Salamanca-Riba, R. Ramesh, I. Naumov, and K. Rabe, Appl. Phys. Lett. 81, 4398 (2002).
19. L. A. Bendersky, D. V. Tsvetkov, and Y. V. Melnik, J. Appl. Phys. 94, 1676 (2003).
20. H. J. Freund (private communication).
21. J. Wollschlager, Defect Diffus. Forum 164, 37 (1998).
22. L. B. Freund and S. Suresh, Thin Film Materials (Cambridge University Press, Cambridge, 2003), p. 387.
23. X. H. Liu, F. M. Ross, and K. W. Schwarz, Phys. Rev. Lett. 85, 4088 (2000).
24. J. W. Matthews, Epitaxial Growth, Part B (Academic, New York, 1975), p. 581.