Device variability and circuit redundancy in signal processing based on nanoswitches

Nanotechnology

Volumn 20, Issue 46, 2009, Pages

  Cervera, Javier ^a   Manzanares, José A ^a   Mafé, Salvador ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

BASIC BUILDING BLOCK; CONDUCTANCE STATE; EXTERNAL SIGNALS; EXTERNAL STIMULUS; FABRICATION PROCESS; KINETIC MONTE CARLO SIMULATION; METAL NANOPARTICLES; MOLECULAR SWITCHES; NANO SCALE; NANO-SWITCHES; NANOSWITCH; NET CHARGES; ORGANIC LIGANDS; PERIODIC VARIATION; PHENOMENOLOGICAL MODELS; PHYSICAL CHARACTERISTICS; RELIABLE COMPONENTS; STOCHASTIC NATURE;

ELECTRODES; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; QUALITY ASSURANCE; REDUNDANCY; RESONANCE; SIMULATORS; SMELTING; STOCHASTIC MODELS;

SIGNAL PROCESSING;

NANOMATERIAL; NANOPARTICLE;

ARTICLE; CONDUCTANCE; MONTE CARLO METHOD; NANOANALYSIS; PRIORITY JOURNAL; SIGNAL PROCESSING; THEORETICAL MODEL;

EID: 70350648732     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/46/465202     Document Type: Article

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