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Volumn 80, Issue 20, 1998, Pages 4526-4529

Shuttle mechanism for charge transfer in coulomb blockade nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DEFORMATION; ELECTRIC FIELD EFFECTS; ELECTRON TUNNELING; MOLECULAR STRUCTURE; MOLECULAR VIBRATIONS; NANOSTRUCTURED MATERIALS; NUMERICAL ANALYSIS;

EID: 0032070901     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.4526     Document Type: Article
Times cited : (394)

References (9)
  • 2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.