Diamond-metal contacts: Interface barriers and real-time characterization

Journal of Physics Condensed Matter

Volumn 21, Issue 36, 2009, Pages

  Evans, D A ^a   Roberts, O R ^a   Williams, G T ^a   Vearey Roberts, A R ^a   Bain, F ^a   Evans, S ^a   Langstaff, D P ^a   Twitchen, D J ^b  

^a ABERYSTWYTH UNIVERSITY   (United Kingdom)

^b ELEMENT SIX LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BANDBENDING; BARRIER HEIGHTS; CARBIDE FORMATION; DIAMOND SURFACES; I-V MEASUREMENTS; IDEALITY FACTORS; IN-SITU; IN-SITU HEATING; INTERFACE BARRIER; INTERFACE CHEMISTRY; INTERFACIAL POTENTIAL; METAL CONTACTS; METAL ELECTRONEGATIVITY; METAL FILM; METAL GROWTH; MICROSCOPIC PROPERTIES; NANOMETRES; NANOSCALE METALS; REAL TIME MEASUREMENTS; REAL TIME MONITORING; SCHOTTKY; SIMPLE MODEL; SINGLE-CRYSTAL SUBSTRATES; SPECTROSCOPIC INVESTIGATIONS; VACUUM ENVIRONMENT;

CARBIDES; CHEMICAL BONDS; DIAMONDS; DISTILLATION; ELECTRONEGATIVITY; FILM GROWTH; FILM PREPARATION; METALLIC FILMS; METALS; OHMIC CONTACTS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; TIME MEASUREMENT;

DIAMOND FILMS;

EID: 70349560395     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/36/364223     Document Type: Article

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