Deep level spectroscopy in homoepitaxial diamond films studied from current transients in schottky junctions

Physica Status Solidi (A) Applied Research

Volumn 174, Issue 1, 1999, Pages 129-135

  Muret, P ^a   Gheeraert, E ^a   Deneuville, A ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001365596     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199907)174:1<129::AID-PSSA129>3.0.CO;2-L     Document Type: Article

References (10)

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9. phys. stat. sol. (a) 174, 117 (1999).
10. M. W. GEIS and J. C. TWICHELL, IEEE Trans. Electron Devices 44, 1514 (1997).