SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 5, 2009, Pages

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

(11) Tranvouez, E a Boer Duchemin, E a Mayne, A J a Vanderbruggen, T a Scheele, M a Cartwright, R a Comtet, G a Dujardin, G a Schneegans, O a Chrtien P a Houz F a

a CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING AFM; HYDROGENATION PROCESS; INHOMOGENEITIES; SIDE LENGTH; SINGLE CRYSTAL DIAMOND; SUBMICRON LENGTH; TRIANGULAR STRUCTURES;

ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; HYDROGENATION; MORPHOLOGY; SURFACE MORPHOLOGY; SURFACE PROPERTIES; SURFACE ROUGHNESS;

SINGLE CRYSTAL SURFACES;

EID: 70349310436 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3211306 Document Type: Article

Times cited : (6)

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