Characterization of locally modified diamond surface using Kelvin probe force microscope

Surface Science

Volumn 581, Issue 2-3, 2005, Pages 207-212

  Tachiki, Minoru ^a,b,d   Kaibara, Yu ^a,b   Sumikawa, Yu ^a,b   Shigeno, Masatsugu ^c   Kanazawa, Hirohumi ^a,b   Banno, Tokishige ^a,b   Song, Kwang Soup ^a,b   Umezawa, Hitoshi ^a,b   Kawarada, Hiroshi ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b WASEDA UNIVERSITY   (Japan)

^c SII NANOTECHNOLOGY INC   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

AFM; Diamond; Hydrogen termination; KFM; Local oxidation; Surface charge; Surface conduction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; DOPING (ADDITIVES); ELECTRIC CHARGE; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; OXIDATION; PLASMA THEORY;

HYDROGEN TERMINATION; KELVIN PROBE FORCE MICROSCOPY; LOCAL OXIDATION; SURFACE CHARGE; SURFACE CONDUCTION;

DIAMONDS;

EID: 17044391470     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.02.054     Document Type: Article

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