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Volumn 91, Issue 7, 2002, Pages 4585-4589

Nanoscale characterization of hydrogenated and oxidized B-doped homoepitaxial diamond by conductive atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONDUCTIVITY DISTRIBUTIONS; H-TERMINATION; HIGH QUALITY; HOMOEPITAXIAL DIAMOND; HOMOEPITAXIAL FILMS; HYDROGENATED FILMS; IV CHARACTERISTICS; NANO SCALE; NANOSCALE CHARACTERIZATION; OXIDIZED FILMS; OXIDIZED SURFACES; SCHOTTKY; STEP EDGE; STRIPE PATTERN; STRUCTURAL DEPENDENCE; TOPOGRAPHY IMAGES;

EID: 0036537113     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1456250     Document Type: Article
Times cited : (3)

References (13)
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.