Resonant electron injection as an atomic-scale tool for surface studies

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 19, 2002, Pages 1954031-1954036

  Bobrov, K ^a   Soukiassian, L ^a   Mayne, A J ^a   Dujardin, G ^a   Hoffman, A ^b  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIAMOND; SILICON;

ARTICLE; ATOM; CONDUCTANCE; ELECTRON; ENERGY; HYDROGENATION; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; TOPOGRAPHY; VACUUM;

EID: 0037113733     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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