Conductance fluctuation and degeneracy in nanocontact between a conductive AFM tip and a granular surface under small-load conditions

Applied Surface Science

Volumn 252, Issue 14, 2006, Pages 5149-5157

  Guo, Deng Zhu ^a   Hou, Shi Min ^a   Zhang, Geng Min ^a   Xue, Zeng Quan ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Atomic force microscope (AFM); Conductance fluctuation and degeneracy; Conductive tip; Nanocontact

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRON TUNNELING; GOLD; GRANULAR MATERIALS; TUNGSTEN COMPOUNDS;

CONDUCTANCE FLUCTUATION AND DEGENERACY; CONDUCTIVE-TIP; NANOCONTACT; NANOELECTRONIC MEASUREMENT;

NANOSTRUCTURED MATERIALS;

EID: 33646544062     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.058     Document Type: Article

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