Nanostructure and performance of Pt-LaNiO3 composite film for ferroelectric film devices

Acta Materialia

Volumn 57, Issue 14, 2009, Pages 4109-4114

  Qiao, Liang ^a   Bi, Xiaofang ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

Ceramic matrix composites (CMC); Ferroelectricity; High resolution electron microscopy (HREM); Nanostructure; Sputtering

Indexed keywords

CERAMIC MATRIX COMPOSITES (CMC); CONDUCTIVE COMPOSITES; ELECTRON-ELECTRON SCATTERING; HIGH-RESOLUTION ELECTRON MICROSCOPY (HREM); INTERFACIAL CHARGE; MATRIX; PT-LANIO; RADIO-FREQUENCY CO-SPUTTERING; REMNANT POLARIZATIONS; TEMPERATURE-DEPENDENT RESISTIVITY;

CERAMIC MATERIALS; CERAMIC MATRIX COMPOSITES; COMPOSITE FILMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON-PHONON INTERACTIONS; ELECTRONS; FERROELECTRIC DEVICES; FERROELECTRIC FILMS; FERROELECTRICITY; NANOSTRUCTURES; PLATINUM; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 67650099328     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.05.008     Document Type: Article

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