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Volumn 102, Issue 4, 2007, Pages

Structural, microstructural, and transport properties of highly oriented LaNiO3 thin films deposited on SrTiO3 (100) single crystal

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; LANTHANUM COMPOUNDS; MICROSTRUCTURE; SINGLE CRYSTALS; TRANSPORT PROPERTIES;

EID: 34548450257     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2769349     Document Type: Article
Times cited : (40)

References (36)
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    • Escote, M.T.1    Barbeta, V.B.2    Jardim, R.F.3    Campo, J.4
  • 31
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    • See, for example, M. T. Escote, V. B. Barbeta, R. F. Jardim, and J. Campo, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/18/26/030 18, 6117 (2006); M. T. Escote, V. A. Mesa, R. F. Jardim, L. Ben-Dor, M. S. Torikachvili, and A. H. Lacerda, Phys. Rev. B 0163-1829 10.1103/PhysRevB.66.144503 66, 144503 (2002).
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    • The vF value can be estimated as follows: vF = (3π n) 1/3 / m*, where n=1.7× 1022 cm-3, by assuming one electron per Ni atom (Ni3+, t 2g 6 eg1) (see Ref. 28).
    • The vF value can be estimated as follows: vF = (3π n) 1/3 / m*, where n=1.7× 1022 cm-3, by assuming one electron per Ni atom (Ni3+, t 2g 6 eg1) (see Ref.).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.